Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams
Abstract
A method has been developed and applied to measure the beam waist and spot size of a focused soft x-ray beam at the free-electron laser FLASH of the Deutsches Elektronen-Synchrotron in Hamburg. The method is based on a saturation effect upon atomic photoionization and represents an indestructible tool for the characterization of powerful beams of ionizing electromagnetic radiation. At the microfocus beamline BL2 at FLASH, a full width at half maximum focus diameter of (15{+-}2) {mu}m was determined.
- Authors:
-
- Physikalisch-Technische Bundesanstalt, Abbestrasse 2-12, 10587 Berlin (Germany)
- Publication Date:
- OSTI Identifier:
- 20880102
- Resource Type:
- Journal Article
- Journal Name:
- Applied Physics Letters
- Additional Journal Information:
- Journal Volume: 89; Journal Issue: 22; Other Information: DOI: 10.1063/1.2397561; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 43 PARTICLE ACCELERATORS; FREE ELECTRON LASERS; PHOTOIONIZATION; SATURATION; SOFT X RADIATION; SYNCHROTRONS; ULTRAVIOLET RADIATION
Citation Formats
Sorokin, A A, Gottwald, A, Hoehl, A, Kroth, U, Schoeppe, H, Ulm, G, Richter, M, Bobashev, S V, Domracheva, I V, Smirnov, D N, Tiedtke, K, Duesterer, S, Feldhaus, J, Hahn, U, Jastrow, U, Kuhlmann, M, Nunez, T, Ploenjes, E, Treusch, R, Ioffe Physico-Technical Institute, Polytekhnicheskaya 26, 194021 St. Petersburg, and Deutsches Elektronen-Synchrotron, Notkestrasse 85, 22603 Hamburg. Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams. United States: N. p., 2006.
Web. doi:10.1063/1.2397561.
Sorokin, A A, Gottwald, A, Hoehl, A, Kroth, U, Schoeppe, H, Ulm, G, Richter, M, Bobashev, S V, Domracheva, I V, Smirnov, D N, Tiedtke, K, Duesterer, S, Feldhaus, J, Hahn, U, Jastrow, U, Kuhlmann, M, Nunez, T, Ploenjes, E, Treusch, R, Ioffe Physico-Technical Institute, Polytekhnicheskaya 26, 194021 St. Petersburg, & Deutsches Elektronen-Synchrotron, Notkestrasse 85, 22603 Hamburg. Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams. United States. https://doi.org/10.1063/1.2397561
Sorokin, A A, Gottwald, A, Hoehl, A, Kroth, U, Schoeppe, H, Ulm, G, Richter, M, Bobashev, S V, Domracheva, I V, Smirnov, D N, Tiedtke, K, Duesterer, S, Feldhaus, J, Hahn, U, Jastrow, U, Kuhlmann, M, Nunez, T, Ploenjes, E, Treusch, R, Ioffe Physico-Technical Institute, Polytekhnicheskaya 26, 194021 St. Petersburg, and Deutsches Elektronen-Synchrotron, Notkestrasse 85, 22603 Hamburg. 2006.
"Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams". United States. https://doi.org/10.1063/1.2397561.
@article{osti_20880102,
title = {Method based on atomic photoionization for spot-size measurement on focused soft x-ray free-electron laser beams},
author = {Sorokin, A A and Gottwald, A and Hoehl, A and Kroth, U and Schoeppe, H and Ulm, G and Richter, M and Bobashev, S V and Domracheva, I V and Smirnov, D N and Tiedtke, K and Duesterer, S and Feldhaus, J and Hahn, U and Jastrow, U and Kuhlmann, M and Nunez, T and Ploenjes, E and Treusch, R and Ioffe Physico-Technical Institute, Polytekhnicheskaya 26, 194021 St. Petersburg and Deutsches Elektronen-Synchrotron, Notkestrasse 85, 22603 Hamburg},
abstractNote = {A method has been developed and applied to measure the beam waist and spot size of a focused soft x-ray beam at the free-electron laser FLASH of the Deutsches Elektronen-Synchrotron in Hamburg. The method is based on a saturation effect upon atomic photoionization and represents an indestructible tool for the characterization of powerful beams of ionizing electromagnetic radiation. At the microfocus beamline BL2 at FLASH, a full width at half maximum focus diameter of (15{+-}2) {mu}m was determined.},
doi = {10.1063/1.2397561},
url = {https://www.osti.gov/biblio/20880102},
journal = {Applied Physics Letters},
issn = {0003-6951},
number = 22,
volume = 89,
place = {United States},
year = {Mon Nov 27 00:00:00 EST 2006},
month = {Mon Nov 27 00:00:00 EST 2006}
}
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