X-Ray Microprobe of Orbital Alignment in Strong-Field Ionized Atoms

Journal Article · Fri Aug 25 00:00:00 EDT 2006 · Physical Review Letters

DOI:https://doi.org/10.1103/PHYSREVLETT.97.083601· OSTI ID:20860718

Young, L; Arms, D A; Dufresne, E M; Dunford, R W; Ederer, D L; Hoehr, C; Kanter, E P; Kraessig, B; Landahl, E C; Peterson, E R; Rudati, J; Santra, R; Southworth, S H ^[1]

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1. Argonne National Laboratory, Argonne, Illinois 60439 (United States)

We have developed a synchrotron-based, time-resolved x-ray microprobe to investigate optical strong-field processes at intermediate intensities (10{sup 14}-10{sup 15} W/cm{sup 2}). This quantum-state specific probe has enabled the direct observation of orbital alignment in the residual ion produced by strong-field ionization of krypton atoms via resonant, polarized x-ray absorption. We found strong alignment to persist for a period long compared to the spin-orbit coupling time scale (6.2 fs). The observed degree of alignment can be explained by models that incorporate spin-orbit coupling. The methodology is applicable to a wide range of problems.

• OSTI ID: 20860718
• Journal Information: Physical Review Letters, Vol. 97, Issue 8; Other Information: DOI: 10.1103/PhysRevLett.97.083601; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

74 ATOMIC AND MOLECULAR PHYSICS
ABSORPTION
ATOMS
IONIZATION
IONS
KRYPTON
L-S COUPLING
SYNCHROTRONS
TIME RESOLUTION
X RADIATION