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Title: Measurements of the hard-x-ray reflectivity of iridium

Journal Article · · Applied Optics
DOI:https://doi.org/10.1364/AO.46.000185· OSTI ID:20854008

In connection with the design of a hard-x-ray telescope for the Constellation X-Ray Observatory we measured the reflectivity of an iridium-coated zerodur substrate as a function of angle at 55, 60, 70, and 80 keV at the National Synchrotron Light Source of Brookhaven National Laboratory. The optical constants were derived from the reflectivity data. The real component of the index of refraction is in excellent agreement with theoretical values at all four energies. However, the imaginary component, which is related to the mass attenuation coefficient, is 50% to 70% larger at 55, 60, and 70 keV than theoretical values.

OSTI ID:
20854008
Journal Information:
Applied Optics, Vol. 46, Issue 2; Other Information: DOI: 10.1364/AO.46.000185; (c) 2007 Optical Society of America; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6935
Country of Publication:
United States
Language:
English

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