Design and performance of a beetle-type double-tip scanning tunneling microscope

Journal Article · Fri Sep 15 00:00:00 EDT 2006 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2336112· OSTI ID:20853651

Jaschinsky, Philipp; Coenen, Peter; Pirug, Gerhard; Voigtlaender, Bert ^[1]

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1. Institut fuer Bio- und Nanosysteme (IBN 3), and Center of Nanoelectronic Systems for Information Technology (cni), Forschungszentrum Juelich, 52425 Juelich (Germany)

A combination of a double-tip scanning tunneling microscope with a scanning electron microscope in ultrahigh vacuum environment is presented. The compact beetle-type design made it possible to integrate two independently driven scanning tunneling microscopes in a small space. Moreover, an additional level for coarse movement allows the decoupling of the translation and approach of the tunneling tip. The position of the two tips can be controlled from the millimeter scale down to 50 nm with the help of an add-on electron microscope. The instrument is capable of atomic resolution imaging with each tip.

• OSTI ID: 20853651
• Journal Information: Review of Scientific Instruments, Vol. 77, Issue 9; Other Information: DOI: 10.1063/1.2336112; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
DESIGN
ELECTRON MICROSCOPES
PERFORMANCE
RESOLUTION
SCANNING ELECTRON MICROSCOPY
SCANNING TUNNELING MICROSCOPY