Radiation induced currents in parallel plate ionization chambers: Measurement and Monte Carlo simulation for megavoltage photon and electron beams
- Department of Medical Physics, McGill University Health Centre, 1650 Avenue Cedar, Montreal, Quebec H3G 1A4 (Canada)
Polarity effects in ionization chambers are caused by a radiation induced current, also known as Compton current, which arises as a charge imbalance due to charge deposition in electrodes of ionization chambers. We used a phantom-embedded extrapolation chamber (PEEC) for measurements of Compton current in megavoltage photon and electron beams. Electron contamination of photon beams and photon contamination of electron beams have a negligible effect on the measured Compton current. To allow for a theoretical understanding of the Compton current produced in the PEEC effect we carried out Monte Carlo calculations with a modified user code, the COMPTON/EGSnrc. The Monte Carlo calculated COMPTON currents agree well with measured data for both photon and electron beams; the calculated polarity correction factors, on the other hand, do not agree with measurement results. The conclusions reached for the PEEC can be extended to parallel-plate ionization chambers in general.
- OSTI ID:
- 20853428
- Journal Information:
- Medical Physics, Vol. 33, Issue 9; Other Information: DOI: 10.1118/1.2208917; (c) 2006 American Association of Physicists in Medicine; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-2405
- Country of Publication:
- United States
- Language:
- English
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