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Title: Robust Bessel-function-based method for determination of the (n,m) indices of single-walled carbon nanotubes by electron diffraction

Abstract

We report a calibration-free method for the determination of chiral indices (n,m) of single-walled carbon nanotubes from their electron diffraction patterns based on Bessel function analysis of the diffracted layer lines. An approach has been developed for confident identification of the orders of the Bessel functions from the intensity modulations of the diffraction layer lines, to which (n,m) are correlated. In particular, we critically evaluate the effect of nanotube inclination on the validity of the method and show that the layer lines governed by high-order Bessel functions tolerate higher tilt angles than those of low-order Bessel functions and thus are favored for (n,m) evaluation. The method is of particular significance in that it considerably enhances the precision of chiral indexing and makes possible the analysis of high-order Bessel functions, especially when EDPs are of relatively low pixel resolution. The technique can be extended to structural analysis of double-walled carbon nanotubes.

Authors:
 [1]; ;  [2];  [1]
  1. VTT Technical Research Center of Finland, P.O. Box 1000, FIN-02044 VTT (Finland)
  2. NanoMaterials Group, Laboratory of Physics and Center for New Materials, Helsinki University of Technology, P.O. Box 1000, FIN-02044 VTT (Finland)
Publication Date:
OSTI Identifier:
20853347
Resource Type:
Journal Article
Journal Name:
Physical Review. B, Condensed Matter and Materials Physics
Additional Journal Information:
Journal Volume: 74; Journal Issue: 3; Other Information: DOI: 10.1103/PhysRevB.74.035427; (c) 2006 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1098-0121
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BESSEL FUNCTIONS; CALIBRATION; CARBON; CHIRALITY; ELECTRON DIFFRACTION; EVALUATION; INDEXES; LAYERS; MODULATION; NANOTUBES; RESOLUTION

Citation Formats

Hua, Jiang, Brown, David P, Nasibulin, Albert G, Kauppinen, Esko I, and NanoMaterials Group, Laboratory of Physics and Center for New Materials, Helsinki University of Technology, P.O. Box 1000, FIN-02044 VTT. Robust Bessel-function-based method for determination of the (n,m) indices of single-walled carbon nanotubes by electron diffraction. United States: N. p., 2006. Web. doi:10.1103/PHYSREVB.74.035427.
Hua, Jiang, Brown, David P, Nasibulin, Albert G, Kauppinen, Esko I, & NanoMaterials Group, Laboratory of Physics and Center for New Materials, Helsinki University of Technology, P.O. Box 1000, FIN-02044 VTT. Robust Bessel-function-based method for determination of the (n,m) indices of single-walled carbon nanotubes by electron diffraction. United States. https://doi.org/10.1103/PHYSREVB.74.035427
Hua, Jiang, Brown, David P, Nasibulin, Albert G, Kauppinen, Esko I, and NanoMaterials Group, Laboratory of Physics and Center for New Materials, Helsinki University of Technology, P.O. Box 1000, FIN-02044 VTT. 2006. "Robust Bessel-function-based method for determination of the (n,m) indices of single-walled carbon nanotubes by electron diffraction". United States. https://doi.org/10.1103/PHYSREVB.74.035427.
@article{osti_20853347,
title = {Robust Bessel-function-based method for determination of the (n,m) indices of single-walled carbon nanotubes by electron diffraction},
author = {Hua, Jiang and Brown, David P and Nasibulin, Albert G and Kauppinen, Esko I and NanoMaterials Group, Laboratory of Physics and Center for New Materials, Helsinki University of Technology, P.O. Box 1000, FIN-02044 VTT},
abstractNote = {We report a calibration-free method for the determination of chiral indices (n,m) of single-walled carbon nanotubes from their electron diffraction patterns based on Bessel function analysis of the diffracted layer lines. An approach has been developed for confident identification of the orders of the Bessel functions from the intensity modulations of the diffraction layer lines, to which (n,m) are correlated. In particular, we critically evaluate the effect of nanotube inclination on the validity of the method and show that the layer lines governed by high-order Bessel functions tolerate higher tilt angles than those of low-order Bessel functions and thus are favored for (n,m) evaluation. The method is of particular significance in that it considerably enhances the precision of chiral indexing and makes possible the analysis of high-order Bessel functions, especially when EDPs are of relatively low pixel resolution. The technique can be extended to structural analysis of double-walled carbon nanotubes.},
doi = {10.1103/PHYSREVB.74.035427},
url = {https://www.osti.gov/biblio/20853347}, journal = {Physical Review. B, Condensed Matter and Materials Physics},
issn = {1098-0121},
number = 3,
volume = 74,
place = {United States},
year = {Sat Jul 15 00:00:00 EDT 2006},
month = {Sat Jul 15 00:00:00 EDT 2006}
}