Profile of single-pulsed ion beams in acceleration gap
- Institute of Electronic Engineering, China Academy of Engineering Physics, P.O. Box 919-523, Mianyang 621900, Sichuan (China)
In an attempt to understand the characteristics of single-pulsed ion beams extracted from a miniature occluded-gas sources with electrodes of metallic hydride, a two-dimensional (2D) projected image of ion beams extracted from the single-pulsed occluded-gas source was captured using a digital charge-coupled device camera on a test bench. Based on image processing and the inverse Abel transform, the 2D integrally projected image with cylindrical symmetry was used to determine the profile of ion beams in the acceleration gap. The result shows that the radial beam profile in acceleration gap has a Gaussian-like shape, and the maximum beam intensity behind the plasma electrode is about 40% higher than that in front of the extraction electrode.
- OSTI ID:
- 20779090
- Journal Information:
- Review of Scientific Instruments, Vol. 77, Issue 3; Conference: 11. international conference on ion sources, Caen (France), 12-16 Sep 2005; Other Information: DOI: 10.1063/1.2167389; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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