Optimization of negative ion sources for a heavy-ion-beam probe

Journal Article · Wed Mar 15 00:00:00 EST 2006 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.2170094· OSTI ID:20779022

Nishiura, M; Ido, T; Shimizu, A; Kato, S; Tsukada, K; Nishizawa, A; Hamada, Y; Matsumoto, Y; Mendenilla, A; Wada, M ^[1]

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1. National Institute for Fusion Science, National Institutes of Natural Sciences, 322-6 Oroshi, Toki, Gifu 509-5292 (Japan)

The development of plasma-sputter-type negative ion sources is underway for the heavy-ion-beam probe system as plasma diagnostic beams of the large helical device (LHD) for potential and fluctuation field measurements. Our purpose is to increase the doubly charged exchanged Au{sup +} beam intensity to enhance the detection signal after passing through the plasmas of the LHD. For this purpose, the characterization of the Au{sup -} ion source and the beam optics has been carried out both experimentally and numerically. Based on these results, a new plasma-sputter-type negative ion source is designed and tested.

• OSTI ID: 20779022
• Journal Information: Review of Scientific Instruments, Vol. 77, Issue 3; Conference: 11. international conference on ion sources, Caen (France), 12-16 Sep 2005; Other Information: DOI: 10.1063/1.2170094; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ANIONS
BEAM OPTICS
BEAM-PLASMA SYSTEMS
DETECTION
FLUCTUATIONS
GOLD IONS
HEAVY IONS
ION BEAMS
ION SOURCES
LHD DEVICE
OPTIMIZATION
PLASMA
PLASMA DIAGNOSTICS
PROBES