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Title: ARTEMIS-B: A room-temperature test electron cyclotron resonance ion source for the National Superconducting Cyclotron Laboratory at Michigan State University

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.2165749· OSTI ID:20778962
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  1. NSCL Michigan State University, East Lansing, Michigan 48824 (United States)

The current scheme for ion-beam injection into the coupled cyclotron accelerator at the NSCL involves the use of two electron cyclotron resonance (ECR) ion sources. The first one is a 6.4 GHz fully superconducting that will be replaced within two years by SUSI, a third generation 18 GHz superconducting ECR ion source. The other source, ARTEMIS, is a room-temperature source based on the AECR-U design and built in collaboration with the University of Jyvaeskylae in 1999. Due to cyclotron operation constraint, very little time can be allowed to ion source development and optics studies of the cyclotron injection beam line. In this context, NSCL has decided to build ARTEMIS-B an exact replica of its room-temperature ECR ion source. The goal of this project is threefold. One is to improve the overall reliability of cyclotron operation through tests and studies of various ion source parameters that could benefit beam stability, tuning reproducibility, and of course overall extracted currents performance. Second is to implement and test modifications or upgrade made to the ion source: extraction geometry, new resistive or rf oven design, dual frequency use, liner, etc. Finally, this test source will be used to study various ion optics schemes such as electrostatic quadrupole doublet or triplet at the source extraction or the use of a correction sextupole and assess their effect on the ion beam through the use of an emittance scanner and imaging viewer that will be incorporated into ARTEMIS-B beam line. This article reviews the design and construction of ARTEMIS-B along with some initial commissioning results.

OSTI ID:
20778962
Journal Information:
Review of Scientific Instruments, Vol. 77, Issue 3; Conference: 11. international conference on ion sources, Caen (France), 12-16 Sep 2005; Other Information: DOI: 10.1063/1.2165749; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English