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Title: Localized spin-wave excitation by the evanescent microwave scanning probe

Abstract

We report a technique for the local contactless spin-wave excitation using the evanescent microwave scanning probe. Our probe is based on a dielectric resonator with the thin slit aperture. It operates at 8.8 GHz, has a spatial resolution of 10-100 {mu}m, and may be operated in the parallel and in the perpendicular magnetic field. The measurements can be performed in contact mode or by scanning the sample at constant probe-sample separation. Using 120-150 nm thick Permalloy films on a glass substrate as test samples, we show how our technique can be used for thickness measurements of thin magnetic films and for the mapping of their magnetic properties, such as magnetization and surface anisotropy.

Authors:
; ; ;  [1]
  1. Racah Institute of Physics, The Hebrew University of Jerusalem, Jerusalem 91904 (Israel)
Publication Date:
OSTI Identifier:
20778742
Resource Type:
Journal Article
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 77; Journal Issue: 2; Other Information: DOI: 10.1063/1.2167131; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ANISOTROPY; APERTURES; DIELECTRIC MATERIALS; GHZ RANGE 01-100; MAGNETIC FIELDS; MAGNETIC PROPERTIES; MEASURING METHODS; MICROWAVE RADIATION; PERMALLOY; PROBES; RESONATORS; SPATIAL RESOLUTION; SPIN WAVES; THICKNESS; THIN FILMS

Citation Formats

Sakran, F, Golosovsky, M, Davidov, D, Monod, P, and ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05. Localized spin-wave excitation by the evanescent microwave scanning probe. United States: N. p., 2006. Web. doi:10.1063/1.2167131.
Sakran, F, Golosovsky, M, Davidov, D, Monod, P, & ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05. Localized spin-wave excitation by the evanescent microwave scanning probe. United States. https://doi.org/10.1063/1.2167131
Sakran, F, Golosovsky, M, Davidov, D, Monod, P, and ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05. 2006. "Localized spin-wave excitation by the evanescent microwave scanning probe". United States. https://doi.org/10.1063/1.2167131.
@article{osti_20778742,
title = {Localized spin-wave excitation by the evanescent microwave scanning probe},
author = {Sakran, F and Golosovsky, M and Davidov, D and Monod, P and ESPCI, 10 rue Vauquelin, 75231 Paris Cedex 05},
abstractNote = {We report a technique for the local contactless spin-wave excitation using the evanescent microwave scanning probe. Our probe is based on a dielectric resonator with the thin slit aperture. It operates at 8.8 GHz, has a spatial resolution of 10-100 {mu}m, and may be operated in the parallel and in the perpendicular magnetic field. The measurements can be performed in contact mode or by scanning the sample at constant probe-sample separation. Using 120-150 nm thick Permalloy films on a glass substrate as test samples, we show how our technique can be used for thickness measurements of thin magnetic films and for the mapping of their magnetic properties, such as magnetization and surface anisotropy.},
doi = {10.1063/1.2167131},
url = {https://www.osti.gov/biblio/20778742}, journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 2,
volume = 77,
place = {United States},
year = {Wed Feb 15 00:00:00 EST 2006},
month = {Wed Feb 15 00:00:00 EST 2006}
}