Dielectric properties of <001>-oriented Ba{sub 0.6}Sr{sub 0.4}TiO{sub 3} thin films on polycrystalline metal tapes using biaxially oriented MgO/{gamma}-Al{sub 2}O{sub 3} buffer layers
- Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545 (United States)
We report the growth of <001>-oriented Ba{sub 0.6}Sr{sub 0.4}TiO{sub 3} (BST) thin films on polycrystalline Ni-alloy tapes by pulsed laser deposition using biaxially oriented, ion-beam-assisted deposited (IBAD) MgO and {gamma}-Al{sub 2}O{sub 3} buffer layers. Dielectric constant values of our BST films were up to {approx}85% of those in the epitaxial films prepared under similar conditions on single-crystal MgO substrates. No significant dispersion of the dielectric constant was observed for frequencies from 100 Hz to 1 MHz. These results demonstrate the versatility of using IBAD-textured MgO and {gamma}-Al{sub 2}O{sub 3} buffer layers to integrate highly oriented good-quality BST films with nonsingle-crystalline substrates.
- OSTI ID:
- 20778681
- Journal Information:
- Applied Physics Letters, Vol. 88, Issue 6; Other Information: DOI: 10.1063/1.2173232; (c) 2006 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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