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Title: A new method to evaluate the quality of single crystal Cu by an X-ray diffraction butterfly pattern method

Abstract

A new method for the evaluation of the quality of an Ohno continuous cast (OCC) Cu single crystal by X-ray diffraction (XRD) butterfly pattern was brought forward. Experimental results show that the growth direction of single crystal Cu is inclined from both sides of the single crystal Cu rod to the axis and is axially symmetric. The degree of deviation from the [100] orientation from the crystal axis is less than 5 deg. with a casting speed 10-40 mm/min. The orientation of single crystal Cu does not have a fixed direction but is in a regular range. Moreover, the orientation of stray grains in the single crystal Cu is random from continuous casting.

Authors:
 [1];  [2];  [1]
  1. School of Environmental Science and Engineering, Shanghai Jiaotong University, 800 Dongchuan Road, Shanghai 200240 (China)
  2. Instrument Analytical Center, Northwestern University, Xi'an 710069 (China)
Publication Date:
OSTI Identifier:
20748653
Resource Type:
Journal Article
Journal Name:
Materials Characterization
Additional Journal Information:
Journal Volume: 53; Journal Issue: 5; Other Information: DOI: 10.1016/j.matchar.2004.09.003; PII: S1044-5803(04)00205-0; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1044-5803
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; AXIAL SYMMETRY; CASTING; CASTINGS; CRYSTAL GROWTH; EVALUATION; MONOCRYSTALS; ORIENTATION; RODS; VELOCITY; X-RAY DIFFRACTION

Citation Formats

Zhenming, Xu, Zhenqi, Guo, and Jianguo, Li. A new method to evaluate the quality of single crystal Cu by an X-ray diffraction butterfly pattern method. United States: N. p., 2004. Web. doi:10.1016/j.matchar.2004.09.003.
Zhenming, Xu, Zhenqi, Guo, & Jianguo, Li. A new method to evaluate the quality of single crystal Cu by an X-ray diffraction butterfly pattern method. United States. https://doi.org/10.1016/j.matchar.2004.09.003
Zhenming, Xu, Zhenqi, Guo, and Jianguo, Li. 2004. "A new method to evaluate the quality of single crystal Cu by an X-ray diffraction butterfly pattern method". United States. https://doi.org/10.1016/j.matchar.2004.09.003.
@article{osti_20748653,
title = {A new method to evaluate the quality of single crystal Cu by an X-ray diffraction butterfly pattern method},
author = {Zhenming, Xu and Zhenqi, Guo and Jianguo, Li},
abstractNote = {A new method for the evaluation of the quality of an Ohno continuous cast (OCC) Cu single crystal by X-ray diffraction (XRD) butterfly pattern was brought forward. Experimental results show that the growth direction of single crystal Cu is inclined from both sides of the single crystal Cu rod to the axis and is axially symmetric. The degree of deviation from the [100] orientation from the crystal axis is less than 5 deg. with a casting speed 10-40 mm/min. The orientation of single crystal Cu does not have a fixed direction but is in a regular range. Moreover, the orientation of stray grains in the single crystal Cu is random from continuous casting.},
doi = {10.1016/j.matchar.2004.09.003},
url = {https://www.osti.gov/biblio/20748653}, journal = {Materials Characterization},
issn = {1044-5803},
number = 5,
volume = 53,
place = {United States},
year = {Wed Dec 15 00:00:00 EST 2004},
month = {Wed Dec 15 00:00:00 EST 2004}
}