EBSD characterization of 8090 Al-Li alloy during dynamic and static recrystallization
Journal Article
·
· Materials Characterization
The microstructures of high-temperature deformed and annealed 8090 Al-Li alloy have been characterized using electron back-scattered diffraction (EBSD). The observed structure refinement, which is attributed to the dynamic and static recrystallization (DRX and SRX, respectively) for the deformation and annealing processes, respectively, was accompanied by a shift in misorientation angle distribution from low- to high-angle side, with more significant effect in the strain-induced case (DRX)
- OSTI ID:
- 20748628
- Journal Information:
- Materials Characterization, Vol. 52, Issue 3; Other Information: DOI: 10.1016/j.matchar.2004.04.009; PII: S1044580304000865; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); ISSN 1044-5803
- Country of Publication:
- United States
- Language:
- English
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