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Title: Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope

Abstract

A carbon nanotube (CNT) was successfully attached to a base probe with a blunt apex and subsequently used as a probe for an atomic force microscope (AFM). This setup demonstrates high spatial resolution properties, plus an advantage: we were able to readily identify the loss of the CNT from the end of the probe by the resultant sudden drop in resolution. This design of probe is expected to feature yet another advantage: that of relative immunity to accidental collision compared to a CNT attached to a commercially available sharp tip. We also discuss the problems specific to CNT-attached probes, which are carbon contamination of the sample surface and artifact images formed at the edge of pit structures. We demonstrate that carbon contamination can be suppressed by a rubbing procedure before the scanning use, and that pit artifacts can be eliminated by optimizing the CNT length.

Authors:
; ; ; ; ;
Publication Date:
OSTI Identifier:
20748620
Resource Type:
Journal Article
Journal Name:
Materials Characterization
Additional Journal Information:
Journal Volume: 52; Journal Issue: 1; Other Information: DOI: 10.1016/j.matchar.2004.03.003; PII: S1044580304000518; Copyright (c) 2004 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 1044-5803
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ATOMIC FORCE MICROSCOPY; CARBON; DESIGN; MICROSCOPES; NANOTUBES; PROBES; SPATIAL RESOLUTION; SURFACES

Citation Formats

Kuwahara, Masashi, Abe, Hidekazu, Tokumoto, Hiroshi, Shima, Takayuki, Tominaga, Junji, and Fukuda, Hajime. Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope. United States: N. p., 2004. Web. doi:10.1016/j.matchar.2004.03.003.
Kuwahara, Masashi, Abe, Hidekazu, Tokumoto, Hiroshi, Shima, Takayuki, Tominaga, Junji, & Fukuda, Hajime. Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope. United States. https://doi.org/10.1016/j.matchar.2004.03.003
Kuwahara, Masashi, Abe, Hidekazu, Tokumoto, Hiroshi, Shima, Takayuki, Tominaga, Junji, and Fukuda, Hajime. 2004. "Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope". United States. https://doi.org/10.1016/j.matchar.2004.03.003.
@article{osti_20748620,
title = {Practical use of a carbon nanotube attached to a blunt apex in an atomic force microscope},
author = {Kuwahara, Masashi and Abe, Hidekazu and Tokumoto, Hiroshi and Shima, Takayuki and Tominaga, Junji and Fukuda, Hajime},
abstractNote = {A carbon nanotube (CNT) was successfully attached to a base probe with a blunt apex and subsequently used as a probe for an atomic force microscope (AFM). This setup demonstrates high spatial resolution properties, plus an advantage: we were able to readily identify the loss of the CNT from the end of the probe by the resultant sudden drop in resolution. This design of probe is expected to feature yet another advantage: that of relative immunity to accidental collision compared to a CNT attached to a commercially available sharp tip. We also discuss the problems specific to CNT-attached probes, which are carbon contamination of the sample surface and artifact images formed at the edge of pit structures. We demonstrate that carbon contamination can be suppressed by a rubbing procedure before the scanning use, and that pit artifacts can be eliminated by optimizing the CNT length.},
doi = {10.1016/j.matchar.2004.03.003},
url = {https://www.osti.gov/biblio/20748620}, journal = {Materials Characterization},
issn = {1044-5803},
number = 1,
volume = 52,
place = {United States},
year = {Mon Mar 15 00:00:00 EST 2004},
month = {Mon Mar 15 00:00:00 EST 2004}
}