High resonant mass sensor evaluation: An effective method
- Instrument Society of America and Society of Manufacturing Engineers, 20 Randall Street, Apt. 5G, Providence, Rhode Island 02904 (United States)
Micro- and nanocantilever mass sensors in higher resonant oscillation modes are very sensitive to an additional mass, which is positioned along their length except for the nodal points. However, the known evaluation methods of this sensitivity are usually complicated, which is not effective in applications for atomic force microscopy. Our solution is simple, unified, and based on the superposition force method, which allows us to estimate effective spring constants, effective mass factors, and correct prediction of sensitivity for nano- and microcantilevers along their length in higher resonant modes. Simple analytical and computer aided calculation algorithms are developed. Calculation results are close to the experimental and computer simulation data within a few percent.
- OSTI ID:
- 20723255
- Journal Information:
- Review of Scientific Instruments, Vol. 76, Issue 11; Other Information: DOI: 10.1063/1.2115207; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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