Scanning low-temperature element-specific magnetic microscopy
Abstract
We have developed a low-temperature element-specific magnetic microscopy instrument at beamline 4-ID-D of the Advanced Photon Source. The setup enables simultaneous chemical and magnetic characterization of materials with {approx}1 {mu}m{sup 2} resolution at low temperature (>10 K) under a moderate applied field (<0.8 T). We demonstrate the potential of this apparatus by presenting results correlating chemical and magnetic local behavior in inhomogeneous layered manganites and multiferroic systems.
- Authors:
-
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
- Publication Date:
- OSTI Identifier:
- 20722904
- Resource Type:
- Journal Article
- Journal Name:
- Review of Scientific Instruments
- Additional Journal Information:
- Journal Volume: 76; Journal Issue: 6; Other Information: DOI: 10.1063/1.1921510; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
- Subject:
- 36 MATERIALS SCIENCE; ADVANCED PHOTON SOURCE; ANTIFERROMAGNETIC MATERIALS; EQUIPMENT; FERROELECTRIC MATERIALS; FERROMAGNETIC MATERIALS; LANTHANUM COMPOUNDS; LUTETIUM COMPOUNDS; MAGNETORESISTANCE; MICROSCOPY; PARAMAGNETISM; RESOLUTION; STRONTIUM COMPOUNDS; TEMPERATURE RANGE 0065-0273 K; X RADIATION
Citation Formats
Cady, A, Haskel, D, Lang, J C, Srajer, G, Chupas, P, Osborn, R, Mitchell, J F, Ahn, J S, Hur, N, Park, S, Cheong, S -W, Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, and Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854. Scanning low-temperature element-specific magnetic microscopy. United States: N. p., 2005.
Web. doi:10.1063/1.1921510.
Cady, A, Haskel, D, Lang, J C, Srajer, G, Chupas, P, Osborn, R, Mitchell, J F, Ahn, J S, Hur, N, Park, S, Cheong, S -W, Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, & Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854. Scanning low-temperature element-specific magnetic microscopy. United States. https://doi.org/10.1063/1.1921510
Cady, A, Haskel, D, Lang, J C, Srajer, G, Chupas, P, Osborn, R, Mitchell, J F, Ahn, J S, Hur, N, Park, S, Cheong, S -W, Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, and Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854. 2005.
"Scanning low-temperature element-specific magnetic microscopy". United States. https://doi.org/10.1063/1.1921510.
@article{osti_20722904,
title = {Scanning low-temperature element-specific magnetic microscopy},
author = {Cady, A and Haskel, D and Lang, J C and Srajer, G and Chupas, P and Osborn, R and Mitchell, J F and Ahn, J S and Hur, N and Park, S and Cheong, S -W and Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439 and Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854},
abstractNote = {We have developed a low-temperature element-specific magnetic microscopy instrument at beamline 4-ID-D of the Advanced Photon Source. The setup enables simultaneous chemical and magnetic characterization of materials with {approx}1 {mu}m{sup 2} resolution at low temperature (>10 K) under a moderate applied field (<0.8 T). We demonstrate the potential of this apparatus by presenting results correlating chemical and magnetic local behavior in inhomogeneous layered manganites and multiferroic systems.},
doi = {10.1063/1.1921510},
url = {https://www.osti.gov/biblio/20722904},
journal = {Review of Scientific Instruments},
issn = {0034-6748},
number = 6,
volume = 76,
place = {United States},
year = {Wed Jun 15 00:00:00 EDT 2005},
month = {Wed Jun 15 00:00:00 EDT 2005}
}
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