An Investigation of 154Eu as a High-Precision Multi-{gamma}-Ray Intensity Calibration Standard for Detector Arrays

Journal Article · Tue May 24 00:00:00 EDT 2005 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1945134· OSTI ID:20722690

Kulp, W D; Wood, J L ^[1]; Krane, K S; Loats, J; Schmelzenbach, P D; Stapels, C J ^[2]; Norman, E B ^[3]

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1. School of Physics, Georgia Institute of Technology, Atlanta, GA 30332-0430 (United States)
2. Department of Physics, Oregon State University, Corvallis, OR 97331-6507 (United States)
3. Nuclear Science Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720 (United States)

The decay of 154Eu has been studied using {gamma}-ray singles and {gamma} - {gamma} coincidence spectroscopy with an array of Compton-suppressed Ge detectors. Particular attention to coincidence summing in the analysis, with consideration of detailed decay cascades and angular correlation effects, suggests that previous studies have overlooked necessary corrections. It is concluded that 154Eu provides 26 {gamma} rays that can be used for relative efficiency calibrations from 120 to 1600 keV at the 0.7% precision level and that this precision could be improved in the future.

• OSTI ID: 20722690
• Journal Information: AIP Conference Proceedings, Vol. 769, Issue 1; Conference: International conference on nuclear data for science and technology, Santa Fe, NM (United States), 26 Sep - 1 Oct 2004; Other Information: DOI: 10.1063/1.1945134; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

73 NUCLEAR PHYSICS AND RADIATION PHYSICS
ACCURACY
ANGULAR CORRELATION
CALIBRATION
CALIBRATION STANDARDS
CORRECTIONS
EFFICIENCY
EUROPIUM 154
GAMMA DETECTION
GAMMA RADIATION
GAMMA SPECTROSCOPY
GE SEMICONDUCTOR DETECTORS
KEV RANGE
NUCLEAR DECAY