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Title: The Effect of Oxygen on the ZnS Electronic Energy-Band Structure

Journal Article · · Semiconductors
DOI:https://doi.org/10.1134/1.1923552· OSTI ID:20718895
; ; ;  [1]; ;  [2]
  1. Moscow Power Institute (Technical University), ul. Krasnokazarmennaya 17, Moscow, 111250 (Russian Federation)
  2. Tomsk Polytechnical University, pr. Lenina 30, Tomsk, 634034 (Russian Federation)

Experimental data indicating that the band gap of Zn-O-S solid solutions decreases appreciably in accordance with the theory of noncrossing energy bands are reported for the first time. It is shown that this effect is mainly characteristic of ZnS with an excess of Zn. The concentration of dissolved oxygen [O{sub S}] has been determined from data taken using precision X-ray structure analysis and chemical phase analysis. The decrease in the band gap determined from the cathodoluminescence spectra is equal to 75 meV for sphalerite ZnS (s) and 90 meV for wurtzite ZnS (w) per 1 mol % and depends virtually linearly on the oxygen concentration [O{sub S}]. An increase in [O{sub S}], in addition to an intensification and shift of the free-exciton (FE) band, is also conducive to the formation of SA oxygen-containing complexes in ZnS. These complexes are responsible for emission in the visible region of the spectrum and for the band I{sub 1} of excitons bound to these complexes. The binding energy is equal to {approx}61 and {approx}104 meV for ZnS (s) and ZnS (w), respectively. The band I{sub 1} shifts as [O{sub S}] varies, similarly to the shift of the FE band. The obtained dependences define the position of the FE band in oxygen-free ZnS and make it possible to assess the oxygen concentration in the compound from the shift of the FE band.

OSTI ID:
20718895
Journal Information:
Semiconductors, Vol. 39, Issue 5; Other Information: Translated from Fizika i Tekhnika Poluprovodnikov, ISSN 0015-3222, 39, 513-520 (No. 5, 2005); DOI: 10.1134/1.1923552; (c) 2005 Pleiades Publishing, Inc; Country of input: International Atomic Energy Agency (IAEA); TN:; ISSN 1063-7826
Country of Publication:
United States
Language:
English