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Title: Hard x-ray nanoprobe based on refractive x-ray lenses

Abstract

Based on nanofocusing refractive x-ray lenses a hard x-ray scanning microscope is currently being developed and is being implemented at beamline ID13 of the European Synchrotron Radiation Facility (Grenoble, France). It can be operated in transmission, fluorescence, and diffraction mode. Tomographic scanning allows one to determine the inner structure of a specimen. In this device, a monochromatic (E=21 keV) hard x-ray nanobeam with a lateral extension of 47x55 nm{sup 2} was generated. Further reduction of the beam size to below 20 nm is targeted.

Authors:
; ; ; ; ; ; ; ; ; ;  [1]
  1. HASYLAB at DESY, Notkestr. 85, D-22607 Hamburg (Germany)
Publication Date:
OSTI Identifier:
20709795
Resource Type:
Journal Article
Journal Name:
Applied Physics Letters
Additional Journal Information:
Journal Volume: 87; Journal Issue: 12; Other Information: DOI: 10.1063/1.2053350; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); Journal ID: ISSN 0003-6951
Country of Publication:
United States
Language:
English
Subject:
74 ATOMIC AND MOLECULAR PHYSICS; DIFFRACTION; EUROPEAN SYNCHROTRON RADIATION FACILITY; FLUORESCENCE; HARD X RADIATION; KEV RANGE 10-100; LENSES; MICROSCOPES; MONOCHROMATIC RADIATION

Citation Formats

Schroer, C G, Kurapova, O, Patommel, J, Boye, P, Feldkamp, J, Lengeler, B, Burghammer, M, Riekel, C, Vincze, L, Hart, A van der, Kuechler, M, II. Physikalisches Institut, Aachen University, D-52056 Aachen, European Synchrotron Radiation Facility ESRF, BP 220, F-38043 Grenoble, Department of Analytical Chemistry, Ghent University, Krijgslaan 281 S12, B-9000 Ghent, ISG, Forschungszentrum Juelich, D-52425 Juelich, and Fraunhofer IZM, Deptartment of Microdevices and Equipment, Reichenhainer Str. 88, D-09126 Chemnitz. Hard x-ray nanoprobe based on refractive x-ray lenses. United States: N. p., 2005. Web. doi:10.1063/1.2053350.
Schroer, C G, Kurapova, O, Patommel, J, Boye, P, Feldkamp, J, Lengeler, B, Burghammer, M, Riekel, C, Vincze, L, Hart, A van der, Kuechler, M, II. Physikalisches Institut, Aachen University, D-52056 Aachen, European Synchrotron Radiation Facility ESRF, BP 220, F-38043 Grenoble, Department of Analytical Chemistry, Ghent University, Krijgslaan 281 S12, B-9000 Ghent, ISG, Forschungszentrum Juelich, D-52425 Juelich, & Fraunhofer IZM, Deptartment of Microdevices and Equipment, Reichenhainer Str. 88, D-09126 Chemnitz. Hard x-ray nanoprobe based on refractive x-ray lenses. United States. https://doi.org/10.1063/1.2053350
Schroer, C G, Kurapova, O, Patommel, J, Boye, P, Feldkamp, J, Lengeler, B, Burghammer, M, Riekel, C, Vincze, L, Hart, A van der, Kuechler, M, II. Physikalisches Institut, Aachen University, D-52056 Aachen, European Synchrotron Radiation Facility ESRF, BP 220, F-38043 Grenoble, Department of Analytical Chemistry, Ghent University, Krijgslaan 281 S12, B-9000 Ghent, ISG, Forschungszentrum Juelich, D-52425 Juelich, and Fraunhofer IZM, Deptartment of Microdevices and Equipment, Reichenhainer Str. 88, D-09126 Chemnitz. 2005. "Hard x-ray nanoprobe based on refractive x-ray lenses". United States. https://doi.org/10.1063/1.2053350.
@article{osti_20709795,
title = {Hard x-ray nanoprobe based on refractive x-ray lenses},
author = {Schroer, C G and Kurapova, O and Patommel, J and Boye, P and Feldkamp, J and Lengeler, B and Burghammer, M and Riekel, C and Vincze, L and Hart, A van der and Kuechler, M and II. Physikalisches Institut, Aachen University, D-52056 Aachen and European Synchrotron Radiation Facility ESRF, BP 220, F-38043 Grenoble and Department of Analytical Chemistry, Ghent University, Krijgslaan 281 S12, B-9000 Ghent and ISG, Forschungszentrum Juelich, D-52425 Juelich and Fraunhofer IZM, Deptartment of Microdevices and Equipment, Reichenhainer Str. 88, D-09126 Chemnitz},
abstractNote = {Based on nanofocusing refractive x-ray lenses a hard x-ray scanning microscope is currently being developed and is being implemented at beamline ID13 of the European Synchrotron Radiation Facility (Grenoble, France). It can be operated in transmission, fluorescence, and diffraction mode. Tomographic scanning allows one to determine the inner structure of a specimen. In this device, a monochromatic (E=21 keV) hard x-ray nanobeam with a lateral extension of 47x55 nm{sup 2} was generated. Further reduction of the beam size to below 20 nm is targeted.},
doi = {10.1063/1.2053350},
url = {https://www.osti.gov/biblio/20709795}, journal = {Applied Physics Letters},
issn = {0003-6951},
number = 12,
volume = 87,
place = {United States},
year = {Mon Sep 19 00:00:00 EDT 2005},
month = {Mon Sep 19 00:00:00 EDT 2005}
}