In situ High-Energy X-Ray Diffraction Study of the Local Structure of Supercooled Liquid Si

Journal Article · Fri Aug 19 00:00:00 EDT 2005 · Physical Review Letters

DOI:https://doi.org/10.1103/PhysRevLett.95.085501· OSTI ID:20699327

Kim, T H; Lee, G W; Gangopadhyay, A K; Kelton, K F ^[1]; Sieve, B; Robinson, D S; Goldman, A I ^[2]; Hyers, R W ^[3]; Rathz, T J ^[4]; Rogers, J R ^[5]

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1. Department of Physics, Washington University, St. Louis, Missouri 63130 (United States)
2. Ames Laboratory USDOE and Department of Physics and Astronomy, Iowa State University, Ames, Iowa, 50011 (United States)
3. University of Massachusetts, Amherst, Massachusetts 01003 (United States)
4. University of Alabama, Huntsville, Alabama 35899 (United States)
5. NASA Marshall Space Flight Center, Huntsville, Alabama 35812 (United States)

Employing the technique of electrostatic levitation, coupled with high-energy x-ray diffraction and rapid data acquisition methods, we have obtained high quality structural data more deeply into the supercooled regime of liquid silicon than has been possible before. No change in coordination number is observed in this temperature region, calling into question previous experimental claims of structural evidence for the existence of a liquid-liquid phase transition.

• OSTI ID: 20699327
• Journal Information: Physical Review Letters, Vol. 95, Issue 8; Other Information: DOI: 10.1103/PhysRevLett.95.085501; (c) 2005 The American Physical Society; Country of input: International Atomic Energy Agency (IAEA); ISSN 0031-9007
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
COORDINATION NUMBER
DATA ACQUISITION
LEVITATION
LIQUIDS
PHASE TRANSFORMATIONS
SEMICONDUCTOR MATERIALS
SILICON
X-RAY DIFFRACTION