An X-ray Focusing System Combining a Sagittally-bent Crystal and a Kirkpatrick-Baez System
- European Synchrotron Radiation Facility, BP 220, 38043 Grenoble cedex (France)
In the production of x-ray microbeams a trade-off between flux and beam size must often be made, particularly when using a bending magnet synchrotron source since the radiation emitted in the horizontal direction is not collimated. To circumvent this problem we have combined the diffraction from a sagitally-bent crystal with the meridional focusing of a Kirkpatrick-Baez (KB) system composed of two reflective surfaces coated with a platinum layer (1st mirror, vertical deflection) and with a Ni/B4C multilayer (2nd mirror, horizontal deflection). The experiments were performed at the ESRF BM5 beamline, for which the most favorable arrangement consisted of illuminating a KB system located faraway from the source with a horizontally converging or diverging beam produced by a sagittally-bent crystal located closer to the source. The 1st mirror demagnified the vertical dimension of the source whilst the 2nd further decreased the beam in the horizontal direction. Several flux/ spot-size configurations were tested by changing the position of the image of the sagittal crystal. The best (preliminary) results gave a focus of 2.6 {mu}m (vertical) x 6.8 {mu}m (horizontal) and an irradiance gain of 2.6 104. These figures were limited by the aberrations of the sagittally-bent crystal.
- OSTI ID:
- 20653064
- Journal Information:
- AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757909; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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