LUCIA - a new 1-7 keV {mu}-XAS Beamline

Journal Article · Wed May 12 00:00:00 EDT 2004 · AIP Conference Proceedings

DOI:https://doi.org/10.1063/1.1757796· OSTI ID:20652941

Janousch, M; Schmidt, Th; Wetter, R; Grolimund, G; Scheidegger, A M ^[1]; Flank, A -M; Lagarde, P; Cauchon, G; Bac, S ^[2]; Dubuisson, J M ^[3]

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1. Paul Scherrer Institute (PSI), CH-5232 Villigen PSI (Switzerland)
2. LURE, Bat 209d, Centre Universitaire Paris-Sud, BP 34, 91898 Orsay Cedex (France)
3. Synchrotron SOLEIL, L'Orme de Merisiers, Saint-Aubin, BP 48, 91192 Gif-sur-Yvette Cedex (France)

LURE-SOLEIL (France) and the Swiss Light Source (SLS) are building together a new micro focused beamline for micro x-ray absorption spectroscopy and micro imaging. This line is designed to deliver a photon flux of the order of 1012 ph/sec on a 1 x 1 {mu}m spot within the energy domain of 0.8 to 7 keV. This beam line is being installed on the X07M straight section of SLS. The source is an APPLE II undulator with a period of 54 mm. The main advantage of this device lies in the delivery of any degree of polarization, linear or circular, over the whole energy range, without the need of a sample-position change. The monochromator will be a fixed exit double crystal equipped with 5 sets of crystals, thanks to the very narrow photon beam from the undulator ( Beryl, KTP, YB66, InSb(111), Si(111) ). The optics includes a first horizontal focusing mirror (spherical), which produces an intermediate source for the horizontal mirror of a Kirkpatrick-Baez (KB) system. The vertical mirror of the KB directly images the source. Finally, a low-pass double mirror filter insures a proper harmonic rejection.

• OSTI ID: 20652941
• Journal Information: AIP Conference Proceedings, Vol. 705, Issue 1; Conference: 8. international conference on synchrotron radiation instrumentation, San Francisco, CA (United States), 25-29 Aug 2003; Other Information: DOI: 10.1063/1.1757796; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
• Country of Publication: United States
• Language: English

Related Subjects

43 PARTICLE ACCELERATORS
ABSORPTION SPECTROSCOPY
BEAM OPTICS
BERYL
CRYSTALS
FOCUSING
IMAGES
INDIUM ANTIMONIDES
KEV RANGE 01-10
MIRRORS
MONOCHROMATORS
PHOTON BEAMS
POLARIZATION
SILICON
SWISS LIGHT SOURCE
SYNCHROTRON RADIATION
WIGGLER MAGNETS
X-RAY SPECTRA
X-RAY SPECTROSCOPY