Radiotracer measurements as a sensitive tool for the detection of metal penetration in molecular-based organic electronics
- Technical Faculty, University of Kiel, Kaiserstrasse 2, 24143 Kiel (Germany)
The metallization of organic thin films is a crucial point in the development of molecular electronics. However, there is no method established yet to detect trace amounts of metal atoms in those thin films. Radiotracer measurements can quantify even very small amounts of material penetrating into the bulk, in our case less than 0.01% of a monolayer. Here, the application of this technique on two different well-characterized organic thin film systems (diindenoperylene and pentacene) is demonstrated. The results show that Ag is mainly adsorbed on the surface, but indicate that already at moderate deposition temperatures Ag can penetrate into the organic thin films and agglomerate at the film/substrate interface.
- OSTI ID:
- 20636938
- Journal Information:
- Applied Physics Letters, Vol. 86, Issue 2; Other Information: DOI: 10.1063/1.1849845; (c) 2005 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
- Country of Publication:
- United States
- Language:
- English
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