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Title: Low-temperature field emission system for development of ultracoherent electron beams

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.1790581· OSTI ID:20636613
; ; ; ; ;  [1]
  1. Kagami Memorial Laboratory for Material Science and Technology, Waseda University, 2-8-26 Nish-waseda, Shinjuku-ku, Tokyo 169-0051 (Japan)

Here, we present the design and test-operation performance of a low-temperature field emission (FE) system which can be employed to image and characterize the FE beam from low-temperature tips. Three radiation shields cooled by liquid helium and liquid nitrogen cryostats surround the FE tips and anodes completely. Once the FE system is cooled down to 5 K, experiments can run for more than 15 h without interruption. The design allows not only for the exchange of tips and anodes by load-lock equipment but also for the adjustment of tip-anode distance using a piezo-tube. Test runs in projection microscopy mode have presented clear diffraction-fringe patterns near the shadows of nano objects at temperatures from room temperature to 5.5 K, indicating that the system is well suited for the investigation of the coherence of electron beam from FE tip.

OSTI ID:
20636613
Journal Information:
Review of Scientific Instruments, Vol. 75, Issue 10; Other Information: DOI: 10.1063/1.1790581; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
Country of Publication:
United States
Language:
English

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