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Title: Crystallization and phase transformations in amorphous NiTi thin films for microelectromechanical systems

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.1783011· OSTI ID:20632726
;  [1]
  1. Department of Mechanical Engineering, Yale University, New Haven, Connecticut 06520 (United States)

Amorphous sputtered nickel-titanium thin films were deposited onto micromachined silicon-nitride membranes and subjected to heating and cooling conditions. Their associated microstructure was monitored directly and simultaneously with in situ transmission electron microscopy. These electron-transparent membranes constrained the NiTi films and rendered it possible for observation of the complete transformation cycle, which includes: the crystallization of the amorphous phase to austenite phase (cubic B2 structure) with heating; and the conversion of austenite (B2) to martensite (monoclinic B19{sup '} structure) with cooling. Electron micrographs show the nucleation and growth of grains occurs at a temperature of 470 deg. C and at a rate that indicates a polymorphic transformation. The onset of martensitic transformation occurs between 25 and 35 deg. C. Calorimetric measurements are consistent with the observed crystallization.

OSTI ID:
20632726
Journal Information:
Applied Physics Letters, Vol. 85, Issue 7; Other Information: DOI: 10.1063/1.1783011; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English