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Title: Preparation of thermally stable TiO{sub 2}-terminated SrTiO{sub 3}(100) substrate surfaces

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.1771461· OSTI ID:20632667
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  1. Institute for Solid State Physics, University of Tokyo, 5-1-5 Kashiwanoha, Kashiwa, 227-8581 (Japan)

We have examined the thermal stability of TiO{sub 2}-terminated SrTiO{sub 3}(100) surfaces obtained by buffered HF etching and widely used as substrates for oxide film growth. In situ coaxial impact-collision ion scattering spectroscopy was used to measure the composition of the terminating atomic layer at temperatures up to 1000 deg. C, simulating a broad range of thin-film growth conditions. The TiO{sub 2} termination of a nonannealed but HF-etched surface was found to start collapsing at temperatures as low as 300 deg. C regardless of atmosphere, showing thermal instability of the chemically cleaved surface. Here, we introduce an alternative way to prepare a stabilized SrTiO{sub 3} surface, which maintains a perfect TiO{sub 2} termination up to 700 deg. C, ideal for the growth of atomically sharp oxide heterointerfaces.

OSTI ID:
20632667
Journal Information:
Applied Physics Letters, Vol. 85, Issue 2; Other Information: DOI: 10.1063/1.1771461; (c) 2004 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English