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Title: High-Resolution Measurements of Photoionization of Ions Using Synchrotron Radiation

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.1619774· OSTI ID:20632631
 [1]; ; ; ;  [1]; ; ;  [2];  [3]; ; ; ; ; ;  [4];  [5]
  1. Department of Physics, MS 220, University of Nevada, Reno, NV 89557-0058 (United States)
  2. Centro de Ciencias Fisicas, UNAM, Apartado Postal 6-96, Cuernavaca 62131 (Mexico)
  3. Centro Nacional de Metrologia, Queretaro 76241 (Mexico)
  4. Advanced Light Source, Lawrence Berkeley National Laboratory, MS 7-100, Berkeley, CA 94720 (United States)
  5. Institute of Physics and Astronomy, University of Aarhus, DK-8000 Aarhus C (Denmark)

Measurement of absolute cross sections for photoionization of ions has become feasible by merging a well-collimated ion beam with a monochromatic beam of synchrotron radiation. An electron cyclotron resonance (ECR) ion source permits such measurements to be extended to multiply charged ions, and makes possible systematic studies along isoelectronic sequences. The evolution of atomic spectra along such sequences is commonly studied theoretically, but the predictive ability of the theoretical methods remains largely untested. Absolute cross-section measurements are presented for the first three ionic members of the isoelectronic sequence of nitrogen (O+, F2+ and Ne3+)

OSTI ID:
20632631
Journal Information:
AIP Conference Proceedings, Vol. 680, Issue 1; Conference: 17. international conference on the application of accelerators in research and industry, Denton, TX (United States), 12-16 Nov 2002; Other Information: DOI: 10.1063/1.1619774; (c) 2003 American Institute of Physics; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English