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Title: Directed assembly of carbon nanotube electronic circuits

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.126772· OSTI ID:20216732
 [1];  [1]
  1. Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831 (United States)

We report on a method for directed assembly of integrated carbon nanotube circuits using selective area chemical vapor deposition on prepatterned catalyst electrodes. The circuits consist of a multiwall carbon nanotube bridging a pair of electrodes, forming a metal/carbon nanotube/metal structure. Electron-beam lithography was used to define electrode sets separated by a desired distance on a SiO{sub 2}/Si substrate. Following metal evaporation and lift-off, molecular jet chemical vapor deposition was used for selective growth of carbon nanotubes on the catalyst electrodes. The carbon nanotubes eventually form a bridge between nearby electrodes consisting of one, or in some cases more than one multiwall nanotubes. The room temperature resistance of the carbon nanotube circuits measured at the electrode leads is typically less than 100 k{omega}. The carbon nanotube circuits were characterized by electronic transport measurements in the temperature range from room temperature to 2 K. (c) 2000 American Institute of Physics.

OSTI ID:
20216732
Journal Information:
Applied Physics Letters, Vol. 76, Issue 25; Other Information: PBD: 19 Jun 2000; ISSN 0003-6951
Country of Publication:
United States
Language:
English