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Title: Single grain boundary characterization of Nb-doped SrTiO{sub 3} bicrystals using ac four-point impedance spectroscopy

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.126428· OSTI ID:20216181
 [1];  [1];  [1];  [1]
  1. Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208 (United States)

AC four-point impedance spectroscopy has been applied to Nb-doped SrTiO{sub 3} bicrystals. Due to the simplified geometry and highly conductive bulk of the bicrystal, the reference impedance of the electrode was significantly reduced, validating the applicability of ac four-point impedance spectroscopy for electroceramics. DC current-voltage characteristics without any interference due to electrodes confirmed these ac measurements. Using ac four-point impedance spectroscopy, grain boundary contributions are isolated and the corresponding grain boundary thickness and resistivity are estimated. (c) 2000 American Institute of Physics.

OSTI ID:
20216181
Journal Information:
Applied Physics Letters, Vol. 76, Issue 18; Other Information: PBD: 1 May 2000; ISSN 0003-6951
Country of Publication:
United States
Language:
English

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