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Title: Microsample testing of single crystalline Ti-52 at% Al and Ti-55.5 at% Al

Conference ·
OSTI ID:20001647

Dislocation activity in two-phase commercial TiAl alloys occurs most readily in the {gamma}-TiAl phase, and measurements of the CRSS of single crystalline {gamma}-TiAl provides a solid foundation for understanding the mechanical performance of these alloys. Single crystals of {gamma}-TiAl with greater than 54.5 at% Al have been grown using the optical float zone crystal growing technique, but single crystals with lower Al content, closer to that of commercial alloys, have not. In the present study, polycrystalline ingots of Ti-52 at% Al have been heat treated to form very large grains, and microsample tensile specimens, which have a nominal gage cross-section of 250{micro}m x 300{micro}m, a gage length of 250{micro}m and an overall length of 3 mm, have been machined from within single grains. Microsample high-temperature stress-strain curves for Ti-55.5 at% Al single crystals oriented along the [001] and [010] are presented. Tensile test results for Ti-52 at% Al tested at 1,073K along the[{bar 2}37], [{bar 1}73] and [{bar 3}44] orientations will also be discussed.

Research Organization:
Johns Hopkins Univ., Baltimore, MD (US)
OSTI ID:
20001647
Report Number(s):
CONF-981104-; ISBN 1-55899-458-0; ISSN 1067-9995; TRN: IM0001%%84
Resource Relation:
Conference: High-Temperature Ordered Intermetallic Alloys VIII, Materials Research Society Symposium Proceedings, Boston, MA (US), 11/30/1998--12/03/1998; Other Information: PBD: 1999; Related Information: In: High-temperature ordered intermetallic alloys VIII. Materials Research Society symposium proceedings: Volume 552, by George, E.P.; Mills, M.J.; Yamaguchi, Masaharu [eds.], [600] pages.
Country of Publication:
United States
Language:
English

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