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Title: Synthesis and Characterization of Pure and Doped Ceria Films by Sol-gel and Sputtering

Abstract

Synthesis and Characterization of Pure and Doped Ceria Films by Sol-gel and Sputtering. KURT T. KOCH (University of Missouri, Rolla, MO, 65409) LAXMIKANT SARAF (Environmental and Molecular Science Laboratory (Part of Pacific Northwest National Laboratory), Richland, Washington 99352). Pure and doped Ceria are known for their ability to gain or lose Oxygen, which is of interest to the Solid Oxide Fuel Cell (SOFC) and catalyst community. Current efforts are focused in SOFCs to reduce the operating temperature of the cell while maintaining ionic conduction. Ceria is known for its high ionic conductivity in the intermediate temperature region. (600-800 C) We have prepared pure and doped Ceria films by Sol-gel and magnetron sputtering methods. These films were characterized by X-ray diffraction (XRD), nuclear reaction analysis (NRA), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), and Oxygen conduction measurements. We have observed greater volume diffusion in nanocrystalline Ceria compared to bulk polycrystalline films as a result of low density. Near surface diffusion properties with increasing temperature indicate a decrease in the volume diffusion as a result of grain growth. However, a linear increase in O2 content at {approx}600nm depth was observed and can be correlated to the redistributionmore » of O2 in the samples. Surface roughness of <111> and <200> oriented Ceria films on Al2O3 and YSZ was observed to be 0.13nm and 0.397nm, respectively. In the case of Ceria grown on YSZ, structural properties from XRD results showed a highly oriented structure with cube on cube growth. XRD results from Ceria grown on Al2O3 showed an oriented state near the surface. structure whose degree of orientation appeared to be partially dependent on substrate temperature. Preliminary XPS results indicate reduction in Ceria from the Ce4+ to Ce3+ state near the surface.« less

Authors:
;
Publication Date:
Research Org.:
Pacific Northwest National Lab., Richland, WA (US)
Sponsoring Org.:
US Department of Energy (US)
OSTI Identifier:
15015209
Report Number(s):
PNNL-SA-39174
KP1301030; TRN: US200509%%346
DOE Contract Number:  
AC05-76RL01830
Resource Type:
Journal Article
Journal Name:
Journal of Undergraduate Research
Additional Journal Information:
Journal Volume: 4; Other Information: PBD: 1 Dec 2004
Country of Publication:
United States
Language:
English
Subject:
30 DIRECT ENERGY CONVERSION; ATOMIC FORCE MICROSCOPY; CATALYSTS; DIFFUSION; GRAIN GROWTH; IONIC CONDUCTIVITY; MAGNETRONS; NUCLEAR REACTION ANALYSIS; ROUGHNESS; SOLID OXIDE FUEL CELLS; SPUTTERING; SUBSTRATES; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY

Citation Formats

Koch, Kurt T, and Saraf, Laxmikant V. Synthesis and Characterization of Pure and Doped Ceria Films by Sol-gel and Sputtering. United States: N. p., 2004. Web.
Koch, Kurt T, & Saraf, Laxmikant V. Synthesis and Characterization of Pure and Doped Ceria Films by Sol-gel and Sputtering. United States.
Koch, Kurt T, and Saraf, Laxmikant V. 2004. "Synthesis and Characterization of Pure and Doped Ceria Films by Sol-gel and Sputtering". United States.
@article{osti_15015209,
title = {Synthesis and Characterization of Pure and Doped Ceria Films by Sol-gel and Sputtering},
author = {Koch, Kurt T and Saraf, Laxmikant V},
abstractNote = {Synthesis and Characterization of Pure and Doped Ceria Films by Sol-gel and Sputtering. KURT T. KOCH (University of Missouri, Rolla, MO, 65409) LAXMIKANT SARAF (Environmental and Molecular Science Laboratory (Part of Pacific Northwest National Laboratory), Richland, Washington 99352). Pure and doped Ceria are known for their ability to gain or lose Oxygen, which is of interest to the Solid Oxide Fuel Cell (SOFC) and catalyst community. Current efforts are focused in SOFCs to reduce the operating temperature of the cell while maintaining ionic conduction. Ceria is known for its high ionic conductivity in the intermediate temperature region. (600-800 C) We have prepared pure and doped Ceria films by Sol-gel and magnetron sputtering methods. These films were characterized by X-ray diffraction (XRD), nuclear reaction analysis (NRA), transmission electron microscopy (TEM), X-ray photoelectron spectroscopy (XPS), atomic force microscopy (AFM), and Oxygen conduction measurements. We have observed greater volume diffusion in nanocrystalline Ceria compared to bulk polycrystalline films as a result of low density. Near surface diffusion properties with increasing temperature indicate a decrease in the volume diffusion as a result of grain growth. However, a linear increase in O2 content at {approx}600nm depth was observed and can be correlated to the redistribution of O2 in the samples. Surface roughness of <111> and <200> oriented Ceria films on Al2O3 and YSZ was observed to be 0.13nm and 0.397nm, respectively. In the case of Ceria grown on YSZ, structural properties from XRD results showed a highly oriented structure with cube on cube growth. XRD results from Ceria grown on Al2O3 showed an oriented state near the surface. structure whose degree of orientation appeared to be partially dependent on substrate temperature. Preliminary XPS results indicate reduction in Ceria from the Ce4+ to Ce3+ state near the surface.},
doi = {},
url = {https://www.osti.gov/biblio/15015209}, journal = {Journal of Undergraduate Research},
number = ,
volume = 4,
place = {United States},
year = {Wed Dec 01 00:00:00 EST 2004},
month = {Wed Dec 01 00:00:00 EST 2004}
}