Formation and Characterization of CdSxTe1-x Alloys Prepared from Thin Film Couples of CdS and CdTe: Preprint
This conference paper describes the alloying between CdS and CdTe at the CdS/CdTe interface is a function of the growth temperature and post-deposition CdCl2 heat treatment (HT). In devices prepared by different techniques, Te-rich CdSxTe1-x alloys with x= 0.04 to 0.08 have been identified. We present our work on thin-film couples of CdS and CdTe, which can withstand higher level of CdCl2 treatment without the adhesion problems typically encountered in the regular device structure. CdS films with a thickness of {approx}100 nm were deposited by chemical-bath deposition on glass/SnO2 substrates, and CdTe films with a thickness of 300 and 800 nm were deposited by close-spaced sublimation. The samples were treated in the presence of vapor CdCl2 at 400-450 C for 5 min. X-ray diffraction and optical analysis of the samples showed that S content in the CdSxTe1-x alloy increased systematically with the CdCl2 HT temperature. CdSxTe1-x alloy with x= 0.14 was identified for the samples treated at 4 30C, which is much higher than expected from the miscibility gap at 430C.
- Research Organization:
- National Renewable Energy Lab., Golden, CO (US)
- Sponsoring Organization:
- US Department of Energy (US)
- DOE Contract Number:
- AC36-99-GO10337
- OSTI ID:
- 15006969
- Report Number(s):
- NREL/CP-520-31435; TRN: US200412%%538
- Resource Relation:
- Conference: Conference title not supplied, Conference location not supplied, Conference dates not supplied; Other Information: PBD: 1 May 2002; Related Information: Prepared for the 29th IEEE PV Specialists Conference, 20-24 May
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
36 MATERIALS SCIENCE
ADHESION
ALLOYS
DEPOSITION
HEAT TREATMENTS
SOLUBILITY
SUBLIMATION
SUBSTRATES
THICKNESS
THIN FILMS
X-RAY DIFFRACTION
PV
CDS
CDTE
THIN FILM COUPLE
DEVICE STRUCTURE
CHEMICAL-BATH DEPOSITION
CLOSE-SPACE SUBLIMATION (CSS)
SOLAR SPECTRUM
HETEROJUNCTION
HOMOJUNCTION
AS-DEPOSITED
GLANCING INCIDENCE X-RAY DIFFRACTION (GIXRD)
AUGER ELECTRON SPECTROSCOPY (AES)
ATOMIC FORCE MICROSCOPY (AFM)
DEVICE PERFORMANCE OPTIMIZATION
ALLOY COMPOSITION
SOLAR ENERGY - PHOTOVOLTAICS