Hard x-ray scanning imaging achieved with bonded multilayer Laue lenses

Huang, Xiaojing; Xu, Weihe; Nazaretski, Evgeny; Bouet, Nathalie; Zhou, Juan; Chu, Yong S.; Yan, Hanfei

doi:10.1364/OE.25.008698

Title: Hard x-ray scanning imaging achieved with bonded multilayer Laue lenses

Journal Article · Wed Apr 05 00:00:00 EDT 2017 · Optics Express

DOI:https://doi.org/10.1364/OE.25.008698· OSTI ID:1413936

Huang, Xiaojing ^[1]; Xu, Weihe ^[1]; Nazaretski, Evgeny ^[1]; Bouet, Nathalie ^[1]; Zhou, Juan ^[1]; Chu, Yong S. ^[1]; Yan, Hanfei ^[1]

Brookhaven National Lab. (BNL), Upton, NY (United States). National Synchrotron Light Source II (NSLS-II)

Here, we report scanning hard x-ray imaging with a monolithic focusing optic consisting of two multilayer Laue lenses (MLLs) bonded together. With optics pre-characterization and accurate control of the bonding process, we show that a common focal plane for both MLLs can be realized at 9.317 keV. Using bonded MLLs, we obtained a scanning transmission image of a star test pattern with a resolution of 50 × 50 nm². By applying a ptychography algorithm, we obtained a probe size of 17 × 38 nm² and an object image with a resolution of 13 × 13 nm². Finally, the significant reduction in alignment complexity for bonded MLLs will greatly extend the application range in both scanning and full-field x-ray microscopies.

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Research Organization:: Brookhaven National Lab. (BNL), Upton, NY (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: SC0012704

OSTI ID:: 1413936

Report Number(s):: BNL-114537-2017-JA; OPEXFF; TRN: US1800593

Journal Information:: Optics Express, Vol. 25, Issue 8; ISSN 1094-4087

Publisher:: Optical Society of America (OSA)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 13 works

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Cited By (6)

Nanofocusing of X-ray free-electron laser using wavefront-corrected multilayer focusing mirrors Matsuyama, S.; Inoue, T.; Yamada, J. Scientific Reports, Vol. 8, Issue 1 https://doi.org/10.1038/s41598-018-35611-0	journal	November 2018
Microscopy Instrumentation and Nanopositioning at NSLS-II: Current Status and Future Directions Nazaretski, E.; Xu, W.; Yan, H. Synchrotron Radiation News, Vol. 31, Issue 5 https://doi.org/10.1080/08940886.2018.1506233	journal	September 2018
High resolution tip-tilt positioning system for a next generation MLL-based x-ray microscope Xu, Weihe; Schlossberger, Noah; Xu, Wei Measurement Science and Technology, Vol. 28, Issue 12 https://doi.org/10.1088/1361-6501/aa8916	journal	November 2017
Multibeam ptychography with synchrotron hard X-rays Hirose, Makoto; Higashino, Takaya; Ishiguro, Nozomu Optics Express, Vol. 28, Issue 2 https://doi.org/10.1364/oe.378083	journal	January 2020
Multi-slice ptychography with large numerical aperture multilayer Laue lenses Öztürk, Hande; Yan, Hanfei; He, Yan Optica, Vol. 5, Issue 5 https://doi.org/10.1364/optica.5.000601	journal	January 2018
Multilayer Laue lenses at high x-ray energies: Performance and applications Murray, Kevin; Pedersen, Anders F.; Mohacsi, Istvan Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2019-01243	text	January 2019

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