Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Seiboth, Frank; Schropp, Andreas; Scholz, Maria; Wittwer, Felix; Rödel, Christian; Wünsche, Martin; Ullsperger, Tobias; Nolte, Stefan; Rahomäki, Jussi; Parfeniukas, Karolis; Giakoumidis, Stylianos; Vogt, Ulrich; Wagner, Ulrich; Rau, Christoph; Boesenberg, Ulrike; Garrevoet, Jan; Falkenberg, Gerald; Galtier, Eric C.; Lee, Hae Ja; Nagler, Bob; Schroer, Christian G.

doi:10.1038/ncomms14623

Title: Perfect X-ray focusing via fitting corrective glasses to aberrated optics

Journal Article · Wed Mar 01 00:00:00 EST 2017 · Nature Communications

DOI:https://doi.org/10.1038/ncomms14623· OSTI ID:1352167

Seiboth, Frank ^[1]; Schropp, Andreas ^[2]; Scholz, Maria ^[2]; Wittwer, Felix ^[3]; Rödel, Christian ^[4]; Wünsche, Martin ^[5]; Ullsperger, Tobias ^[5]; Nolte, Stefan ^[5]; Rahomäki, Jussi ^[6];

^[6]; Giakoumidis, Stylianos ^[6]; Vogt, Ulrich ^[6]; Wagner, Ulrich ^[7]; Rau, Christoph ^[7]; Boesenberg, Ulrike ^[2]; Garrevoet, Jan ^[2]; Falkenberg, Gerald ^[2]; Galtier, Eric C. ^[8]; Lee, Hae Ja ^[8]; Nagler, Bob ^[8] more »

Technische Univ. Dresden, Dresden (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Technische Univ. Dresden, Dresden (Germany); Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany)
Friedrich-Schiller-Univ. Jena, Jena (Germany); SLAC National Accelerator Lab., Menlo Park, CA (United States)
Friedrich-Schiller-Univ. Jena, Jena (Germany)
Albanova Univ. Center, Stockholm (Sweden)
Diamond Light Source Ltd., Oxfordshire (United Kingdom)
SLAC National Accelerator Lab., Menlo Park, CA (United States)
Deutsches Elektronen-Synchrotron (DESY), Hamburg (Germany); Univ. Hamburg, Hamburg (Germany)

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. As a result, this scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

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Research Organization:: SLAC National Accelerator Laboratory (SLAC), Menlo Park, CA (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: AC02-76SF00515

OSTI ID:: 1352167

Journal Information:: Nature Communications, Vol. 8; ISSN 2041-1723

Publisher:: Nature Publishing GroupCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 98 works

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