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Title: Impacts of SiO2 planarization on optical thin film properties and laser damage resistance

Authors:
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Publication Date:
OSTI Identifier:
1331458
Report Number(s):
LLNL-CONF-703780
DOE Contract Number:
AC52-07NA27344
Resource Type:
Conference
Resource Relation:
Conference: Presented at: SPIE Laser Damage, Boulder, CO, United States, Sep 26 - Sep 28, 2016
Research Org:
Lawrence Livermore National Laboratory (LLNL), Livermore, CA
Sponsoring Org:
USDOE
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 36 MATERIALS SCIENCE; 42 ENGINEERING