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Title: All About PID - Testing and Avoidance in the Field

Journal Article · · Photovoltaics International
OSTI ID:1326899

Potential-induced degradation can cause significant power loss in modules if the appropriate precautions are not taken. In the first part of a new series in PV Tech Power on module failure, Peter Hacke and Steve Johnston assess the current state-of-the-art in detecting, avoiding and mitigating the worst effects of PID.

Research Organization:
National Renewable Energy Lab. (NREL), Golden, CO (United States)
Sponsoring Organization:
USDOE Office of Energy Efficiency and Renewable Energy (EERE), Renewable Power Office. Solar Energy Technologies Office
DOE Contract Number:
AC36-08GO28308
OSTI ID:
1326899
Report Number(s):
NREL/JA-5J00-66799
Journal Information:
Photovoltaics International, Vol. 33
Country of Publication:
United States
Language:
English