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Title: Applications of Doppler-Free Saturation Spectroscopy for Edge Physics Studies

Doppler-free saturation spectroscopy provides a very powerful method to obtained detailed information about the electronic structure of the atom through measurement of the spectral line profile. This is achieved through a significant decrease in the Doppler broadening and essentially an elimination of the instrument broadening inherent to passive spectroscopic techniques. In this paper we will present the technique and associated physics of Doppler-free saturation spectroscopy in addition to how one selects the appropriate transition. Simulations of H spectra will be presented to illustrate the increased sensitivity to both electric field and electron density measurements.
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  1. ORNL
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Resource Relation:
Journal Volume: 87; Journal Issue: 11; Conference: High Temperature Plasma Diagnostics, Madison, WI, USA, 20160605, 20160609
Research Org:
Oak Ridge National Laboratory (ORNL), Oak Ridge, TN (United States)
Sponsoring Org:
USDOE Office of Science (SC)
Country of Publication:
United States
Doppler-free Saturation Spectroscopy