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Title: Auger recombination in long-wave infrared InAs/InAsSb type-II superlattices

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4939147· OSTI ID:1323900

The Auger lifetime is a critical intrinsic parameter for infrared photodetectors as it determines the longest potential minority carrier lifetime and consequently the fundamental limitations to their performance. Here, Auger recombination is characterized in a long-wave infrared InAs/InAsSb type-II superlattice. Auger coefficients as small as 7.1×10–26 cm6/s are experimentally measured using carrier lifetime data at temperatures in the range of 20 K–80 K. The data are compared to Auger-1 coefficients predicted using a 14-band K•p electronic structure model and to coefficients calculated for HgCdTe of the same bandgap. In conclusion, the experimental superlattice Auger coefficients are found to be an order-of-magnitude smaller than HgCdTe.

Research Organization:
Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sponsoring Organization:
USDOE National Nuclear Security Administration (NNSA)
Grant/Contract Number:
AC04-94AL85000
OSTI ID:
1323900
Report Number(s):
SAND-2015-11141J; APPLAB; 616459
Journal Information:
Applied Physics Letters, Vol. 107, Issue 26; ISSN 0003-6951
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 27 works
Citation information provided by
Web of Science

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Visualizing period fluctuations in strained-layer superlattices with scanning tunneling microscopy journal January 2018
Gold plasmonic material for enhanced Hg 1–x Cd x Te infrared absorption journal October 2019
Enhanced emission from ultra-thin long wavelength infrared superlattices on epitaxial plasmonic materials journal January 2020
Recent advances in manufacturing of miniaturized uncooled IR detection modules journal February 2019
Enhanced Emission from Ultra-Thin Long Wavelength Infrared Superlattices on Epitaxial Plasmonic Materials conference January 2020
Measurement of carrier lifetime in micron-scaled materials using resonant microwave circuits journal April 2019