Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging
- Authors:
-
- Fraunhofer Institute for Solar Energy Systems, Heidenhofstraβe 2, D-79110 Freiburg, Germany
- Massachusetts Institute of Technology, Cambridge, Massachusetts 02139, USA
- Department of Materials Science and Engineering, Korea University, 145 Anam-ro, Seongbuk-gu, Seoul 136-713, South Korea
- FUTURE-PV Innovation, Koriyama, Fukushima 963-0215, Japan
- Kyoto University, Yoshida-Honmachi, Sakyo-Ku, Kyoto 606-8501, Japan
- Publication Date:
- Sponsoring Org.:
- USDOE
- OSTI Identifier:
- 1322422
- Resource Type:
- Journal Article: Publisher's Accepted Manuscript
- Journal Name:
- Journal of Applied Physics
- Additional Journal Information:
- Journal Name: Journal of Applied Physics Journal Volume: 120 Journal Issue: 10; Journal ID: ISSN 0021-8979
- Publisher:
- American Institute of Physics
- Country of Publication:
- United States
- Language:
- English
Citation Formats
Schön, Jonas, Youssef, Amanda, Park, Sungeun, Mundt, Laura E., Niewelt, Tim, Mack, Sebastian, Nakajima, Kazuo, Morishita, Kohei, Murai, Ryota, Jensen, Mallory A., Buonassisi, Tonio, and Schubert, Martin C. Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging. United States: N. p., 2016.
Web. doi:10.1063/1.4961465.
Schön, Jonas, Youssef, Amanda, Park, Sungeun, Mundt, Laura E., Niewelt, Tim, Mack, Sebastian, Nakajima, Kazuo, Morishita, Kohei, Murai, Ryota, Jensen, Mallory A., Buonassisi, Tonio, & Schubert, Martin C. Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging. United States. https://doi.org/10.1063/1.4961465
Schön, Jonas, Youssef, Amanda, Park, Sungeun, Mundt, Laura E., Niewelt, Tim, Mack, Sebastian, Nakajima, Kazuo, Morishita, Kohei, Murai, Ryota, Jensen, Mallory A., Buonassisi, Tonio, and Schubert, Martin C. 2016.
"Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging". United States. https://doi.org/10.1063/1.4961465.
@article{osti_1322422,
title = {Identification of lifetime limiting defects by temperature- and injection-dependent photoluminescence imaging},
author = {Schön, Jonas and Youssef, Amanda and Park, Sungeun and Mundt, Laura E. and Niewelt, Tim and Mack, Sebastian and Nakajima, Kazuo and Morishita, Kohei and Murai, Ryota and Jensen, Mallory A. and Buonassisi, Tonio and Schubert, Martin C.},
abstractNote = {},
doi = {10.1063/1.4961465},
url = {https://www.osti.gov/biblio/1322422},
journal = {Journal of Applied Physics},
issn = {0021-8979},
number = 10,
volume = 120,
place = {United States},
year = {Thu Sep 08 00:00:00 EDT 2016},
month = {Thu Sep 08 00:00:00 EDT 2016}
}
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Cited by: 20 works
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