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Title: Laser-based mass spectrometry of fullerenes and their compounds

Journal Article · · Bulletin of the American Physical Society
OSTI ID:127753
; ;  [1]
  1. Argonne National Lab., IL (United States); and others

Advanced mass spectrometry is used to study C{sub 60}, related carbon clusters named fullerenes, and metallofullerenes. For analysis, the authors rely on laser desorption/laser ionization. Pulsed laser beams (532 nm and 266 nm) are used for desorption of sample material adsorbed on a stainless steel substrate. Postionization of the desorbed neutral flux of molecules is investigated at various wavelengths to optimize the ionization process and minimize the concurrent fragmentation and delayed ionization processes. The applied postionization wavelengths range from 532 nm down to 118 nm. The 118 nm vacuum ultraviolet (VUV) radiation is generated by nonresonant four-wave mixing. In addition, the authors also use a difference mixing scheme, which not only provides tunability in the VUV range, but also at least an order of magnitude more intensity. Additionally, this VUV radiation allows postionization of neutral species following fragmentation by a laser with a longer wavelength (three-laser experiment), thus the neutral fragments resulting from photofragmentation can also be studied.

Research Organization:
Argonne National Lab. (ANL), Argonne, IL (United States)
DOE Contract Number:
W-31109-ENG-38
OSTI ID:
127753
Report Number(s):
CONF-920376-; ISSN 0003-0503; TRN: 95:007049-0004
Journal Information:
Bulletin of the American Physical Society, Vol. 37, Issue 9; Conference: Meeting of the American Physical Society, Indianapolis, IN (United States), 16-20 Mar 1992; Other Information: PBD: Dec 1992
Country of Publication:
United States
Language:
English