High temperature Hall measurement setup for thin film characterization

Adnane, L.; Gokirmak, A.; Silva, H.

doi:10.1063/1.4959222

Title: High temperature Hall measurement setup for thin film characterization

Journal Article · Tue Jul 26 00:00:00 EDT 2016 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4959222· OSTI ID:1272653

^[1]; Gokirmak, A. ^[1];

^[1]

Electrical and Computer Engineering, University of Connecticut, Storrs, Connecticut 06269, USA

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Sponsoring Organization:: USDOE

Grant/Contract Number:: FG02-10ER46774; SC0005038

OSTI ID:: 1272653

Journal Information:: Review of Scientific Instruments, Journal Name: Review of Scientific Instruments Vol. 87 Journal Issue: 7; ISSN 0034-6748

Publisher:: American Institute of PhysicsCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 11 works

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References (16)

Hall effect measurement in the diamond anvil high‐pressure cell Patel, Dinesh; Crumbaker, Todd E.; Sites, James R. Review of Scientific Instruments, Vol. 57, Issue 11 https://doi.org/10.1063/1.1139045	journal	November 1986
In situ Hall measurements at temperatures up to 1100 degrees C with selectable gas atmospheres Fleischer, M.; Meixner, H. Measurement Science and Technology, Vol. 5, Issue 5 https://doi.org/10.1088/0957-0233/5/5/018	journal	May 1994
On a New Action of the Magnet on Electric Currents Hall, E. H. American Journal of Mathematics, Vol. 2, Issue 3 https://doi.org/10.2307/2369245	journal	September 1879
High-Temperature Hall Measurements on BaSnO3Ceramics Ostrick, Bernhard; Fleischer, Maximilian; Meixner, Hans Journal of the American Ceramic Society, Vol. 80, Issue 8 https://doi.org/10.1111/j.1151-2916.1997.tb03102.x	journal	August 1997
Micro-four-point probe Hall effect measurement method Petersen, Dirch H.; Hansen, Ole; Lin, Rong Journal of Applied Physics, Vol. 104, Issue 1 https://doi.org/10.1063/1.2949401	journal	July 2008
Thermoelectrics Nolas, George S.; Sharp, Jeffrey; Goldsmid, H. Julian Springer Series in Materials Science https://doi.org/10.1007/978-3-662-04569-5	book	January 2001
Unified equations for the slope, intercept, and standard errors of the best straight line York, Derek; Evensen, Norman M.; Martı́nez, Margarita López American Journal of Physics, Vol. 72, Issue 3 https://doi.org/10.1119/1.1632486	journal	March 2004
EuO. I. Resistivity and Hall Effect in Fields up to 150 kOe Shapira, Y.; Foner, S.; Reed, T. B. Physical Review B, Vol. 8, Issue 5 https://doi.org/10.1103/PhysRevB.8.2299	journal	September 1973
Hall measurements of bilayer structures Jain, S. H.; Griffin, P. B.; Plummer, J. D. Journal of Applied Physics, Vol. 93, Issue 2 https://doi.org/10.1063/1.1529093	journal	January 2003
Modeling of carrier mobility against carrier concentration in arsenic-, phosphorus-, and boron-doped silicon Masetti, G.; Severi, M.; Solmi, S. IEEE Transactions on Electron Devices, Vol. 30, Issue 7 https://doi.org/10.1109/T-ED.1983.21207	journal	July 1983
High temperature setup for measurements of Seebeck coefficient and electrical resistivity of thin films using inductive heating Adnane, L.; Williams, N.; Silva, H. Review of Scientific Instruments, Vol. 86, Issue 10 https://doi.org/10.1063/1.4934577	journal	October 2015
Electrical Properties of Pure Silicon and Silicon Alloys Containing Boron and Phosphorus Pearson, G. L.; Bardeen, J. Physical Review, Vol. 75, Issue 5 https://doi.org/10.1103/PhysRev.75.865	journal	March 1949
A sensitive method of Hall measurement Lomas, R. A.; Hampshire, M. J.; Tomlinson, R. D. Journal of Physics E: Scientific Instruments, Vol. 5, Issue 8 https://doi.org/10.1088/0022-3735/5/8/029	journal	August 1972
Resistivity of Bulk Silicon and of Diffused Layers in Silicon Irvin, John C. Bell System Technical Journal, Vol. 41, Issue 2 https://doi.org/10.1002/j.1538-7305.1962.tb02415.x	journal	March 1962
Theory of an Experiment for Measuring the Mobility and Density of Carriers in the Space-Charge Region of a Semiconductor Surface Petritz, Richard L. Physical Review, Vol. 110, Issue 6 https://doi.org/10.1103/PhysRev.110.1254	journal	June 1958
Ettingshausen Effect and Thermomagnetic Cooling O'Brien, B. J.; Wallace, C. S. Journal of Applied Physics, Vol. 29, Issue 7 https://doi.org/10.1063/1.1723352	journal	July 1958

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