Scaling effects in sodium zirconium silicate phosphate (Na1+xZr2SixP3-xO12) ion-conducting thin films

Ihlefeld, Jon F.; Gurniak, Emily; Jones, Brad H.; Wheeler, David R.; Rodriguez, Mark A.; McDaniel, Anthony H.

doi:10.1111/jace.14285

Title: Scaling effects in sodium zirconium silicate phosphate (Na₁₊_xZr₂Si_xP_3-_xO₁₂) ion-conducting thin films

Journal Article · Wed May 04 00:00:00 EDT 2016 · Journal of the American Ceramic Society

DOI:https://doi.org/10.1111/jace.14285· OSTI ID:1262309

Ihlefeld, Jon F. ^[1]; Gurniak, Emily ^[1]; Jones, Brad H. ^[1]; Wheeler, David R. ^[1]; Rodriguez, Mark A. ^[1]; McDaniel, Anthony H. ^[2]

Sandia National Lab. (SNL-NM), Albuquerque, NM (United States)
Sandia National Lab. (SNL-CA), Livermore, CA (United States)

Preparation of sodium zirconium silicate phosphate (Na SIC on), Na ₁₊ _x Z r ₂ Si _x P ₃₋ _x O ₁₂ (0.25 ≤ x ≤ 1.0), thin films has been investigated via a chemical solution approach on platinized silicon substrates. Increasing the silicon content resulted in a reduction in the crystallite size and a reduction in the measured ionic conductivity. Processing temperature was also found to affect microstructure and ionic conductivity with higher processing temperatures resulting in larger crystallite sizes and higher ionic conductivities. The highest room temperature sodium ion conductivity was measured for an x = 0.25 composition at 2.3 × 10 ⁻⁵ S/cm. The decreasing ionic conductivity trends with increasing silicon content and decreasing processing temperature are consistent with grain boundary and defect scattering of conducting ions.

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Research Organization:: Sandia National Lab. (SNL-NM), Albuquerque, NM (United States); Sandia National Lab. (SNL-CA), Livermore, CA (United States)

Sponsoring Organization:: USDOE National Nuclear Security Administration (NNSA)

Grant/Contract Number:: AC04-94AL85000

OSTI ID:: 1262309

Alternate ID(s):: OSTI ID: 1401430

Report Number(s):: SAND-2016-6422J; 643969

Journal Information:: Journal of the American Ceramic Society, Journal Name: Journal of the American Ceramic Society; ISSN 0002-7820

Publisher:: American Ceramic SocietyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 22 works

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Title: Scaling effects in sodium zirconium silicate phosphate (Na₁₊_xZr₂Si_xP_3-_xO₁₂) ion-conducting thin films