Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge

Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin; Upton, Mary; Taherkhani, Mehran; Spiwek, Manfred; Dill, Frank-Uwe; Wille, Hans-Christian; Yavaş, Hasan

doi:10.1107/s1600577515009686

Title: Resonant inelastic X-ray scattering spectrometer with 25meV resolution at the Cu K -edge

Journal Article · Sat Jun 27 00:00:00 EDT 2015 · Journal of Synchrotron Radiation (Online)

DOI:https://doi.org/10.1107/s1600577515009686· OSTI ID:1261158

Ketenoglu, Didem; Harder, Manuel; Klementiev, Konstantin; Upton, Mary; Taherkhani, Mehran; Spiwek, Manfred; Dill, Frank-Uwe; Wille, Hans-Christian; Yavaş, Hasan

An unparalleled resolution is reported with an inelastic X-ray scattering instrument at the CuK-edge. Based on a segmented concave analyzer, featuring single-crystal quartz (SiO₂) pixels, the spectrometer delivers a resolution near 25meV (FWHM) at 8981eV. Besides the quartz analyzer, the performance of the spectrometer relies on a four-bounce Si(553) high-resolution monochromator and focusing Kirkpatrick–Baez optics. The measured resolution agrees with the ray-tracing simulation of an ideal spectrometer. The performance of the spectrometer is demonstrated by reproducing the phonon dispersion curve of a beryllium single-crystal.

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Research Organization:: Argonne National Laboratory (ANL), Argonne, IL (United States)

Sponsoring Organization:: USDOE

Grant/Contract Number:: BMBF 05K13PE2k; BIDEB-2219

OSTI ID:: 1261158

Journal Information:: Journal of Synchrotron Radiation (Online), Vol. 22, Issue 4; ISSN 1600-5775

Publisher:: International Union of CrystallographyCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 20 works

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Detecting Crystallographic Lattice Chirality using Resonant Inelastic X-ray Scattering Mongan, Sean; Huang, Zengye; Datta, Trinanjan Scientific Reports, Vol. 9, Issue 1 https://doi.org/10.1038/s41598-019-49157-2	journal	September 2019
A 1-m non-resonant inelastic x-ray scattering spectrometer at BL15U, Shanghai Synchrotron Radiation Facility Ni, Dong-Dong; Kang, Xu; Yan, Shuai Review of Scientific Instruments, Vol. 89, Issue 8 https://doi.org/10.1063/1.5030032	journal	August 2018
Construction of a quartz spherical analyzer: application to high-resolution analysis of the Ni K α emission spectrum Honnicke, Marcelo Goncalves; Bianco, Leonardo M.; Ceppi, Sergio A. Journal of Applied Crystallography, Vol. 49, Issue 5 https://doi.org/10.1107/s1600576716010633	journal	August 2016
Correct interpretation of diffraction properties of quartz crystals for X-ray optics applications Huang, Xian-Rong; Gog, Thomas; Kim, Jungho Journal of Applied Crystallography, Vol. 51, Issue 1 https://doi.org/10.1107/s1600576717018155	journal	February 2018
X-ray back-diffraction: can we further increase the energy resolution by tuning the energy slightly below that of exact backscattering? Hönnicke, Marcelo Goncalves; Cusatis, Cesar; Conley, Raymond Journal of Applied Crystallography, Vol. 52, Issue 6 https://doi.org/10.1107/s1600576719012925	journal	October 2019
New materials for high-energy-resolution x-ray optics Yavaş, Hasan; Sutter, John P.; Gog, Thomas MRS Bulletin, Vol. 42, Issue 06 https://doi.org/10.1557/mrs.2017.94	journal	June 2017
A multi-MHz single-shot data acquisition scheme with high dynamic range: pump–probe X-ray experiments at synchrotrons Britz, Alexander; Assefa, Tadesse; Galler, Andreas Deutsches Elektronen-Synchrotron, DESY, Hamburg https://doi.org/10.3204/pubdb-2016-06049	text	January 2016
A multi-MHz single-shot data acquisition scheme with high dynamic range: pump–probe X-ray experiments at synchrotrons Britz, Alexander; Assefa, Tadesse A.; Galler, Andreas Journal of Synchrotron Radiation, Vol. 23, Issue 6 https://doi.org/10.1107/s1600577516012625	journal	October 2016

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