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This content will become publicly available on December 23, 2016

Title: Impact of x-ray dose on track formation and data analysis for CR-39-based proton diagnostics

The nuclear track detector CR-39 is used extensively for charged particle diagnosis, in particular proton spectroscopy, at inertial confinement fusion facilities. These detectors can absorb x-ray doses from the experiments in the order of 1–100 Gy, the effects of which are not accounted for in the previous detector calibrations. X-ray dose absorbed in the CR-39 has previously been shown to affect the track size of alpha particles in the detector, primarily due to a measured reduction in the material bulk etch rate [Rojas-Herrera et al., Rev. Sci. Instrum. 86, 033501 (2015)]. Similar to the previous findings for alpha particles, protons with energies in the range 0.5–9.1 MeV are shown to produce tracks that are systematically smaller as a function of the absorbed x-ray dose in the CR-39. The reduction of track size due to x-ray dose is found to diminish with time between exposure and etching if the CR-39 is stored at ambient temperature, and complete recovery is observed after two weeks. Lastly, the impact of this effect on the analysis of data from existing CR-39-based proton diagnostics on OMEGA and the National Ignition Facility is evaluated and best practices are proposed for cases in which the effect of xmore » rays is significant.« less
 [1] ;  [2] ;  [3] ;  [2] ;  [2] ;  [2] ;  [2] ;  [4] ;  [2] ;  [2] ;  [2] ;  [5] ;  [6] ;  [5] ;  [5] ;  [5]
  1. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Lawrence Livermore National Lab. (LLNL), Livermore, CA (United States)
  2. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
  3. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Los Alamos National Lab. (LANL), Los Alamos, NM (United States)
  4. Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States); Univ. of Rochester, Rochester, NY (United States)
  5. State Univ. of New York at Geneseo, Geneseo, NY (United States)
  6. Rochester Institute of Technology, Rochester, NY (United States)
Publication Date:
OSTI Identifier:
Grant/Contract Number:
Accepted Manuscript
Journal Name:
Review of Scientific Instruments
Additional Journal Information:
Journal Volume: 86; Journal Issue: 12; Journal ID: ISSN 0034-6748
American Institute of Physics (AIP)
Research Org:
Massachusetts Inst. of Technology (MIT), Cambridge, MA (United States)
Sponsoring Org:
USDOE National Nuclear Security Administration (NNSA)
Country of Publication:
United States
70 PLASMA PHYSICS AND FUSION TECHNOLOGY protons; x-ray effects; x-ray spectra; etching; charged particle spectroscopy