Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy

Mazet, Lucie; Jesse, Stephen; Niu, Gang; Schroeder, Thomas; Schamm-Chardon, Sylvie; Dubourdieu, Catherine; Baddorf, Arthur P.; Kalinin, Sergei V.; Yang, Sang Mo; Okatan, M. Baris

doi:10.1063/1.4954276

Title: Decoupling indirect topographic cross-talk in band excitation piezoresponse force microscopy imaging and spectroscopy

Journal Article · Mon Jun 20 00:00:00 EDT 2016 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4954276· OSTI ID:1259425

Mazet, Lucie ^[1]; Jesse, Stephen ^[2]; Niu, Gang ^[3]; Schroeder, Thomas ^[3]; Schamm-Chardon, Sylvie ^[4]; Dubourdieu, Catherine ^[1]; Baddorf, Arthur P. ^[2]; Kalinin, Sergei V. ^[2]; Yang, Sang Mo ^[2]; Okatan, M. Baris ^[2]

Univ. de Lyon (France)
Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States)
Innovations for High Performance Microelectronics (IHP), Frankfurt (Germany)
Univ. de Toulouse, Toulouse (France)

Here, all scanning probe microscopies are subjected to topographic cross-talk, meaning the topography-related contrast in functional images. Here, we investigate the signatures of indirect topographic cross-talk in piezoresponse force microscopy (PFM) imaging and spectroscopy and its decoupling using band excitation (BE) method in ferroelectric BaTiO₃ deposited on the Si substrates with free standing nanopillars of diameter 50 nm. Comparison between the single-frequency PFM and BE-PFM results shows that the measured signal can be significantly distorted by topography-induced shifts in the contact resonance frequency and cantilever transfer function. However, with proper correction, such shifts do not affect PFM imaging and hysteresis loop measurements. This suggests the necessity of an advanced approach, such as BE-PFM, for detection of intrinsic sample piezoresponse on the topographically non-uniform surfaces.

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Research Organization:: Oak Ridge National Lab. (ORNL), Oak Ridge, TN (United States). Center for Nanophase Materials Sciences (CNMS)

Sponsoring Organization:: USDOE Office of Science (SC)

Grant/Contract Number:: AC05-00OR22725

OSTI ID:: 1259425

Journal Information:: Applied Physics Letters, Vol. 108, Issue 25; ISSN 0003-6951

Publisher:: American Institute of Physics (AIP)Copyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 15 works

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References (20)

Nanoscale ferroelectrics: processing, characterization and future trends Gruverman, A.; Kholkin, A. Reports on Progress in Physics, Vol. 69, Issue 8 https://doi.org/10.1088/0034-4885/69/8/R04	journal	July 2006
Local polarization dynamics in ferroelectric materials Kalinin, Sergei V.; Morozovska, Anna N.; Chen, Long Qing Reports on Progress in Physics, Vol. 73, Issue 5, Article No. 056502 https://doi.org/10.1088/0034-4885/73/5/056502	journal	April 2010
Nanoscale studies of defect-mediated polarization switching dynamics in ferroelectric thin film capacitors Yang, Sang Mo; Yoon, Jong-Gul; Noh, Tae Won Current Applied Physics, Vol. 11, Issue 5 https://doi.org/10.1016/j.cap.2011.05.017	journal	September 2011
Nanoscale polarization manipulation and imaging of ferroelectric Langmuir-Blodgett polymer films Rodriguez, Brian J.; Jesse, Stephen; Kalinin, Sergei V. Applied Physics Letters, Vol. 90, Issue 12 https://doi.org/10.1063/1.2715102	journal	March 2007
Restricted domain growth and polarization reversal kinetics in ferroelectric polymer thin films Gysel, Roman; Stolichnov, Igor; Tagantsev, Alexander K. Journal of Applied Physics, Vol. 103, Issue 8 https://doi.org/10.1063/1.2907990	journal	April 2008
High-Resolution Studies of Domain Switching Behavior in Nanostructured Ferroelectric Polymers Sharma, Pankaj; Reece, Timothy J.; Ducharme, Stephen Nano Letters, Vol. 11, Issue 5 https://doi.org/10.1021/nl200221z	journal	May 2011
Nanoscale piezoresponse of 70 nm poly(vinylidene fluoride-trifluoro-ethylene) films annealed at different temperatures Choi, Yoon-Young; Hong, Jongin; Hong, Seungbum physica status solidi (RRL) - Rapid Research Letters, Vol. 4, Issue 3-4 https://doi.org/10.1002/pssr.201004009	journal	April 2010
Electromechanical imaging of biological systems with sub-10nm resolution Kalinin, Sergei V.; Rodriguez, B. J.; Jesse, S. Applied Physics Letters, Vol. 87, Issue 5 https://doi.org/10.1063/1.2006984	journal	August 2005
Biological Ferroelectricity Uncovered in Aortic Walls by Piezoresponse Force Microscopy Liu, Yuanming; Zhang, Yanhang; Chow, Ming-Jay Physical Review Letters, Vol. 108, Issue 7 https://doi.org/10.1103/PhysRevLett.108.078103	journal	February 2012
Analysis of shape effects on the piezoresponse in ferroelectric nanograins with and without adsorbates Peter, F.; Rüdiger, A.; Dittmann, R. Applied Physics Letters, Vol. 87, Issue 8 https://doi.org/10.1063/1.2010603	journal	August 2005
Resolution theory, and static and frequency-dependent cross-talk in piezoresponse force microscopy Jesse, S.; Guo, S.; Kumar, A. Nanotechnology, Vol. 21, Issue 40 https://doi.org/10.1088/0957-4484/21/40/405703	journal	September 2010
Band excitation in scanning probe microscopy: sines of change Jesse, Stephen; Kalinin, Sergei V. Journal of Physics D: Applied Physics, Vol. 44, Issue 46 https://doi.org/10.1088/0022-3727/44/46/464006	journal	November 2011
Piezoresponse force microscopy (PFM) Soergel, Elisabeth Journal of Physics D: Applied Physics, Vol. 44, Issue 46, Article No. 464003 https://doi.org/10.1088/0022-3727/44/46/464003	journal	November 2011
Dual-frequency resonance-tracking atomic force microscopy Rodriguez, Brian J.; Callahan, Clint; Kalinin, Sergei V. Nanotechnology, Vol. 18, Issue 47, Article No. 475504 https://doi.org/10.1088/0957-4484/18/47/475504	journal	October 2007
The band excitation method in scanning probe microscopy for rapid mapping of energy dissipation on the nanoscale Jesse, Stephen; Kalinin, Sergei V.; Proksch, Roger Nanotechnology, Vol. 18, Issue 43 https://doi.org/10.1088/0957-4484/18/43/435503	journal	September 2007
Band Excitation in Scanning Probe Microscopy: Recognition and Functional Imaging Jesse, S.; Vasudevan, R. K.; Collins, L. Annual Review of Physical Chemistry, Vol. 65, Issue 1 https://doi.org/10.1146/annurev-physchem-040513-103609	journal	April 2014
Nanostructured silicon for Ge nanoheteroepitaxy Bauer, J.; Yamamoto, Y.; Zaumseil, P. Microelectronic Engineering, Vol. 97 https://doi.org/10.1016/j.mee.2012.03.033	journal	September 2012
Structural study and ferroelectricity of epitaxial BaTiO ₃ films on silicon grown by molecular beam epitaxy Mazet, L.; Bachelet, R.; Louahadj, L. Journal of Applied Physics, Vol. 116, Issue 21 https://doi.org/10.1063/1.4902165	journal	December 2014
A review of molecular beam epitaxy of ferroelectric BaTiO ₃ films on Si, Ge and GaAs substrates and their applications Mazet, Lucie; Yang, Sang Mo; Kalinin, Sergei V. Science and Technology of Advanced Materials, Vol. 16, Issue 3 https://doi.org/10.1088/1468-6996/16/3/036005	journal	June 2015
WSXM : A software for scanning probe microscopy and a tool for nanotechnology Horcas, I.; Fernández, R.; Gómez-Rodríguez, J. M. Review of Scientific Instruments, Vol. 78, Issue 1 https://doi.org/10.1063/1.2432410	journal	January 2007

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Towards nanoscale electrical measurements in liquid by advanced KPFM techniques: a review Collins, Liam; Kilpatrick, Jason I.; Kalinin, Sergei V. Reports on Progress in Physics, Vol. 81, Issue 8 https://doi.org/10.1088/1361-6633/aab560	journal	July 2018
Investigations of ferroelectric polycrystalline bulks and thick films using piezoresponse force microscopy Uršič, Hana; Prah, Uroš Proceedings of the Royal Society A: Mathematical, Physical and Engineering Sciences, Vol. 475, Issue 2223 https://doi.org/10.1098/rspa.2018.0782	journal	March 2019

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