Effective efficiency measurement results conducted on a x-band thin film waveguide barretter mount developed at NPL, New Delhi

Conference · Sat Dec 31 00:00:00 EST 1994

OSTI ID:125876

Bhatnagar, H M; Kothari, P C ^[1]

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1. National Physical Lab., New Delhi (India)

Effective efficiency measurements have been conducted at 10.0 GHz using a single load microcalorimetric technique on a thin film primary standard waveguide barretter mount designed and fabricated at National Physical Laboratory, New Delhi. The same mount was taken to three National Laboratories, namely NIST, USA; KRISS, Republic of Korea; PTB, Germany for an international comparison of effective efficiency measurements. This paper briefly describes the techniques employed for the measurement of effective efficiency of bolometer mounts by these countries. The results of effective efficiency are reported and intercomared.

• OSTI ID: 125876
• Report Number(s): CONF-940603-; TRN: 95:005769-0268
• Resource Relation: Conference: CPEM `94: conference on precision electromagnetic measurements, Boulder, CO (United States), 27 Jun - 1 Jul 1994; Other Information: PBD: 1994; Related Information: Is Part Of 1994 Conference on precision electromagnetic measurements digest; DeWeese, E.; Bennett, G. [eds.]; PB: 577 p.
• Country of Publication: United States
• Language: English

Related Subjects

44 INSTRUMENTATION
INCLUDING NUCLEAR AND PARTICLE DETECTORS
42 ENGINEERING NOT INCLUDED IN OTHER CATEGORIES
BOLOMETERS
EFFICIENCY
ACCURACY
THIN FILMS
WAVEGUIDES