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Correlation Between Measured Minority-Carrier Lifetime and $$\hbox{Cu}( \hbox{In}, \hbox{Ga})\hbox{Se}_{2}$$ Device Performance

Journal Article · · IEEE Transactions on Electron Devices
Research Organization:
NREL (National Renewable Energy Laboratory (NREL), Golden, CO (United States))
Sponsoring Organization:
USDOE
DOE Contract Number:
AC36-08GO28308
OSTI ID:
1252683
Report Number(s):
NREL/JA-520-47305
Journal Information:
IEEE Transactions on Electron Devices, Journal Name: IEEE Transactions on Electron Devices Journal Issue: 11 Vol. 57; ISSN 0018-9383
Publisher:
IEEE
Country of Publication:
United States
Language:
English

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