Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity

Helveg, S.; Kisielowski, C. F.; Jinschek, J. R.; Specht, P.; Yuan, G.; Frei, H.

doi:10.1016/j.micron.2014.07.009

Title: Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity

Journal Article · Sat Aug 23 00:00:00 EDT 2014 · Micron

DOI:https://doi.org/10.1016/j.micron.2014.07.009· OSTI ID:1511422

Helveg, S. ^[1]; Kisielowski, C. F. ^[2]; Jinschek, J. R. ^[3]; Specht, P. ^[4]; Yuan, G. ^[2]; Frei, H. ^[2]

Haldor Topsøe A/S, Lyngby (Denmark)
Lawrence Berkeley National Lab. (LBNL), Berkeley, CA (United States)
FEI Company, Eindhoven (Netherlands)
Univ. of California, Berkeley, CA (United States)

Transmission electron microscopy (TEM) has become an indispensable technique for studying heterogeneous catalysts. Specifically, advancements of aberration-corrected electron optics and data acquisition schemes have made TEM capable of delivering images of catalysts with sub-Ångström resolution and single-atom sensitivity. Parallel developments of differentially pumped electron microscopes and of gas cells enable in situ observations of catalysts during the exposure to reactive gas environments at pressures of up to atmospheric levels and temperatures of up to several hundred centigrade. Here, we outline how to take advantage of the emerging state-of-the-art instrumentation and methodologies to study surface structures and dynamics to improve the understanding of structure-sensitive catalytic functionality. The idea of using low electron dose-rates in TEM in conjunction with in-line holography and aberration-correction at low voltage (80kV) is introduced to allow maintaining atomic resolution and sensitivity during in situ observations of catalysts. Benefits are demonstrated by exit wave reconstructions of TEM images of a nanocrystalline Co₃O₄catalyst material acquired in situ during their exposure to either a reducing or oxidizing gas environment.

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Research Organization:: Lawrence Berkeley National Laboratory (LBNL), Berkeley, CA (United States)

Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-05CH11231

OSTI ID:: 1511422

Alternate ID(s):: OSTI ID: 1250594

Journal Information:: Micron, Vol. 68, Issue C; ISSN 0968-4328

Publisher:: ElsevierCopyright Statement

Country of Publication:: United States

Language:: English

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Cited by: 30 works

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Title: Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity

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