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Title: A one-dimensional ion beam figuring system for x-ray mirror fabrication

Journal Article · · Review of Scientific Instruments
DOI:https://doi.org/10.1063/1.4934806· OSTI ID:1247685
 [1];  [1];  [1];  [1];  [1];  [1];  [2];  [3];  [3];  [3];  [4]
  1. Brookhaven National Lab. (BNL), Upton, NY (United States)
  2. Argonne National Lab. (ANL), Argonne, IL (United States)
  3. Kaufman & Robinson, Inc., Fort Collins, CO (United States)
  4. National Univ. of Defense Technology, Hunan (China); Hu’nan Key Laboratory of Ultra-precision Machining Technology, Hunan (China)

We report on the development of a one-dimensional Ion Beam Figuring (IBF) system for x-ray mirror polishing. Ion beam figuring provides a highly deterministic method for the final precision figuring of optical components with advantages over conventional methods. The system is based on a state of the art sputtering deposition system outfitted with a gridded radio frequency inductive coupled plasma ion beam source equipped with ion optics and dedicated slit developed specifically for this application. Here, the production of an IBF system able to produce an elongated removal function rather than circular is presented in this paper, where we describe in detail the technical aspect and present the first obtained results.

Research Organization:
Argonne National Laboratory (ANL), Argonne, IL (United States)
Sponsoring Organization:
USDOE Office of Science (SC), Basic Energy Sciences (BES)
Grant/Contract Number:
AC02-06CH11357; SC0012704; NCET-13-0165
OSTI ID:
1247685
Alternate ID(s):
OSTI ID: 1421270
Journal Information:
Review of Scientific Instruments, Vol. 86, Issue 10; ISSN 0034-6748
Publisher:
American Institute of Physics (AIP)Copyright Statement
Country of Publication:
United States
Language:
English
Citation Metrics:
Cited by: 19 works
Citation information provided by
Web of Science

References (13)

Focusing mirror for x-ray free-electron lasers journal August 2008
Mathematical modeling and application of removal functions during deterministic ion beam figuring of optical surfaces Part 1: Mathematical modeling journal January 2014
Current status of the NSLS-II optical metrology laboratory
  • Idir, Mourad; Kaznatcheev, Konstantine; Qian, Shinan
  • Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, Vol. 710 https://doi.org/10.1016/j.nima.2012.10.122
journal May 2013
Ion Beam Technology: Figuring, Adding and Smoothing for High-precision Optics conference January 2014
Ion figuring of large prototype mirror segments for the E-ELT conference July 2014
X-ray mirror metrology using SCOTS/deflectometry conference September 2013
Ion beam figuring (IBF) for high precision optics conference February 2010
Single-nanometer focusing of hard x-rays by Kirkpatrick–Baez mirrors journal September 2011
The NSLS-II multilayer Laue lens deposition system conference August 2009
IBF technology for nanomanufacturing technology conference October 2010
A 2 D high accuracy slope measuring system based on a Stitching Shack Hartmann Optical Head journal January 2014
Mathematical modeling and application of removal functions during deterministic ion beam figuring of optical surfaces Part 2: application journal January 2014
Ion beam figuring for lithography optics journal May 2009

Cited By (3)

Deflectometry encoding the measured angle in a time-dependent intensity signal journal February 2019
Long, elliptically bent, active X-ray mirrors with slope errors <200 nrad journal April 2017
X-ray scattering by the fused silica surface etched by low-energy Ar ions journal October 2019

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