Evaluation of defects in cuprous oxide through exciton luminescence imaging

Frazer, Laszlo; Lenferink, Erik J.; Chang, Kelvin B.; Poeppelmeier, Kenneth R.; Stern, Nathaniel P.; Ketterson, John B.

doi:10.1016/j.jlumin.2014.11.035

Title: Evaluation of defects in cuprous oxide through exciton luminescence imaging

Journal Article · Sun Mar 01 00:00:00 EST 2015 · Journal of Luminescence

DOI:https://doi.org/10.1016/j.jlumin.2014.11.035· OSTI ID:1246747

; Lenferink, Erik J.; Chang, Kelvin B.; Poeppelmeier, Kenneth R.; Stern, Nathaniel P.; Ketterson, John B.

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Sponsoring Organization:: USDOE Office of Science (SC), Basic Energy Sciences (BES)

Grant/Contract Number:: AC02-06CH11357; AC36-08GO28308

OSTI ID:: 1246747

Journal Information:: Journal of Luminescence, Journal Name: Journal of Luminescence Vol. 159 Journal Issue: C; ISSN 0022-2313

Publisher:: ElsevierCopyright Statement

Country of Publication:: Netherlands

Language:: English

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Cited by: 9 works

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References (43)

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